نتایج جستجو برای: feedback shift register

تعداد نتایج: 310371  

1979
J. H. VAN LINT F. J. MACWILLIAMS N. J. A. SLOANE

An arrays of O's and l's has the u v horizontal window property if every nonzero view is seen once when a u v window is moved horizontally across the array. We study the problem of constructing an array which, for a given m, has the u x v horizontal window property for all factorizations rn uv. Using maximal linear shift register sequences for the rows we are able to construct such arrays of si...

2004
Håkan Englund Martin Hell Thomas Johansson

In 1985 Siegenthaler introduced the concept of correlation attacks on LFSR based stream ciphers. A few years later Meier and Staffelbach demonstrated a special technique, usually referred to as fast correlation attacks, that is very effective if the feedback polynomial has a special form, namely, if its weight is very low. Due to this seminal result, it is a well known fact that one avoids low ...

2012
Janaki Rani S. Malarkkan Adrian Nunez Borivoje Nikolic Yongpan Liu Robert P. Dick Li Shang Huazhong Yang M. C. Johnson D. Somasekhar L. Y. Chiou

As the CMOS technology is scaling down, leakage power has become one of the most critical design concerns for the chip designer. This paper proposes a low leakage linear feedback shift register that can be used in a crypto-processor. In this work, three bit, four bit and five bit linear feedback shift registers are implemented in 90nm and 65nm technology . This paper also proposes two leakage r...

2017
S.Ravi Chand K. Rudra Rao

The aim of testing of VLSI circuits is high-quality screening of the circuits by targeting performance related faults. A low hardware overhead test pattern generator (TPG) for scan based BIST that can detect the any faults in the circuit under test and analyze their response .It is a new fault coverage test pattern generator using a liner feedback shift register (LFSR) called FC-LFSR can perfor...

2013
HEMASUNDARA RAO

The structure of test system based on application built-in self-test (BIST) circuitries has been proposed. The main idea is oriented on minimization of hardware overheads and dealt with automatization of BIST-circuitries generation. Test generator based on linear feedback shift register (LFSR) provides two types of testing pseudorandom and deterministic. The proposed modified Berlekamp–Massey a...

2006
Mark Goresky Andrew Klapper

This is a study of some of the elementary statistical properties of the bitwise exclusive or of two maximum period feedback with carry shift register sequences. We obtain condition under which the resulting sequences has the maximum possible period, and we obtain bounds on the variation in the distribution of blocks of a fixed length. This may lead to improved design of stream ciphers using FCS...

Journal: :Prikladnaya diskretnaya matematika. Prilozhenie 2019

Journal: :ACM Transactions on Design Automation of Electronic Systems 2011

Journal: :Iraqi Journal for Electrical and Electronic Engineering 2016

نمودار تعداد نتایج جستجو در هر سال

با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید