This article describes a defect-oriented test (DOT) approach, which enables complete physical defect-based automatic pattern generation (ATPG) for the digital logic area of CMOS-based designs. Total critical (TCA)-based methods are presented needed DOT views to enable DOT-based patterns detecting all cell-internal and as well cell-external defects. The major aim these new is further reduce defe...

Abstract Organizations that manufacture high volumes of complex products (e.g., pharmaceutical, automotive, food) require specific strategies to ensure efficient processing parts and a sustainable level inventory by waste minimization. A review literature sources revealed how is classified managed amongst organizations industries key challenges current face with existing management systems. In ...