نتایج جستجو برای: nanoscale beam

تعداد نتایج: 135855  

Journal: :Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2013
A D Darbal K J Ganesh X Liu S-B Lee J Ledonne T Sun B Yao A P Warren G S Rohrer A D Rollett P J Ferreira K R Coffey K Barmak

Stereological analysis has been coupled with transmission electron microscope (TEM) orientation mapping to investigate the grain boundary character distribution in nanocrystalline copper thin films. The use of the nanosized (<5 nm) beam in the TEM for collecting spot diffraction patterns renders an order of magnitude improvement in spatial resolution compared to the analysis of electron backsca...

2010
Jie Rao Helin Zou R.R.A. Syms E. Cheng Chong Liu

A method based on the sidewall transfer technique for fabricating two-dimensional (2D) nano-mold on a silicon substrate was developed. Instead of using expensive nanolithography, the authors fabricated 2D silicon nano-mold using standard ultraviolet lithography, conformal deposition of gold by radio frequency sputtering, argon sputter etching and deep reactive ion etching (DRIE). This technique...

Journal: :ACS nano 2010
Wechung Maria Wang Nimrod Stander Randall M Stoltenberg David Goldhaber-Gordon Zhenan Bao

This study evaluates an alternative to electron-beam lithography for fabricating nanoscale graphene devices. Dip-pen nanolithography is used for defining monolayer graphene flakes and for patterning of gold electrodes through writing of an alkylthiol on thin films of gold evaporated onto graphene flakes. A wet gold etching step was used to form the individual devices. The sheet resistances of t...

Journal: :The journal of physical chemistry letters 2016
Mohd S Alias Yang Yang Tien K Ng Ibrahim Dursun Dong Shi Makhsud I Saidaminov Davide Priante Osman M Bakr Boon S Ooi

The high optical gain and absorption of organic-inorganic hybrid perovskites have attracted attention for photonic device applications. However, owing to the sensitivity of organic moieties to solvents and temperature, device processing is challenging, particularly for patterning. Here, we report the direct patterning of perovskites using chemically gas-assisted focused-ion beam (GAFIB) etching...

2017
Thuc Hue Ly Jiong Zhao Magdalena Ola Cichocka Lain-Jong Li Young Hee Lee

Whether and how fracture mechanics needs to be modified for small length scales and in systems of reduced dimensionality remains an open debate. Here, employing in situ transmission electron microscopy, atomic structures and dislocation dynamics in the crack tip zone of a propagating crack in two-dimensional (2D) monolayer MoS2 membrane are observed, and atom-to-atom displacement mapping is obt...

Journal: :Journal of synchrotron radiation 2015
Tim Salditt Markus Osterhoff Martin Krenkel Robin N Wilke Marius Priebe Matthias Bartels Sebastian Kalbfleisch Michael Sprung

A compound optical system for coherent focusing and imaging at the nanoscale is reported, realised by high-gain fixed-curvature elliptical mirrors in combination with X-ray waveguide optics or different cleaning apertures. The key optical concepts are illustrated, as implemented at the Göttingen Instrument for Nano-Imaging with X-rays (GINIX), installed at the P10 coherence beamline of the PETR...

2004
Yongqi Fu Ngoi Kok Ann Bryan

Holes with different sizes from microscale to nanoscale were directly fabricated by focused ion beam (FIB) milling in this paper. Maximum aspect ratio of the fabricated holes can be 5:1 for the hole with large size with pure FIB milling, 10:1 for gas assistant etching, and 1:1 for the hole with size below 100 nm. A phenomenon of volume swell at the boundary of the hole was observed. The reason ...

2013
K. A. Twedt L. Chen J. J. McClelland

We present a new nanoscale imaging technique based on detecting backscattered ions from a lithium focused ion beam (FIB). Scanning ion microscopes are of general interest as they provide image contrast that differs from scanning electron microscopes (SEM), as has been demonstrated with the traditional gallium FIB and the helium ion microscope [1]. Like helium, the low mass of lithium makes it i...

2014
Juan Andrés Lourdes Gracia Patricio Gonzalez-Navarrete Valeria M. Longo Waldir Avansi Diogo P. Volanti Mateus M. Ferrer Pablo S. Lemos Felipe A. La Porta Antonio C. Hernandes Elson Longo

In this work, we utilise a combination of theory, computation and experiments to understand the early events related to the nucleation of Ag filaments on α-Ag2WO4 crystals, which is driven by an accelerated electron beam from an electron microscope under high vacuum. The growth process and the chemical composition and elemental distribution in these filaments were analysed in depth at the nanos...

2016
Sven C. Sidenstein Elisa D’Este Marvin J. Böhm Johann G. Danzl Vladimir N. Belov Stefan W. Hell

Superresolution fluorescence microscopy of multiple fluorophores still requires development. Here we present simultaneous three-colour stimulated emission depletion (STED) nanoscopy relying on a single STED beam at 620 nm. Toggling the STED beam between two or more power levels ("multilevelSTED") optimizes resolution and contrast in all colour channels, which are intrinsically co-aligned and we...

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