نتایج جستجو برای: scale integrated circuits

تعداد نتایج: 875607  

Journal: :Proceedings of the National Academy of Sciences 2020

Journal: :The Journal of Korean Institute of Communications and Information Sciences 2013

Journal: :IEEE Journal of Solid-State Circuits 2020

Journal: :IEEE Journal of Solid-state Circuits 2022

This Special Section of the IEEE Journal Solid-State Circuits (JSSC) features expanded versions key articles presented at 2021 Custom Integrated Conference (CICC), which for second time in a row was fully virtual due to coronavirus pandemic. Originally planned be held Austin, TX, USA, unpredictability COVID-19 quickly lead conference organization decide (again) go format from April 25 30, 2021....

Journal: :Electronics 2021

One of the most challenging tasks for analog and digital designers is to maintain circuit performances by developing novel structures, robust, reliable, capable operating with low supply voltage [...]

Journal: :Electronics 2023

This paper presents a compact hybrid G-band (170–260 GHz) heterodyne receiver module incorporating both Millimeter Microwave Integrated Circuits (MMICs) and Schottky diode-based circuit. An on-chip sextupler Low Noise Amplifier (LNA), along with Sub-Harmonic Mixer (SHM), are integrated into the demonstrated singular module, which is carefully designed arranged co-simulations in electromagnetic ...

Journal: :Micromachines 2012
Kristjan Leosson Björn Agnarsson

We describe how the amorphous fluoropolymer CYTOP can be advantageously used as a waveguide cladding material in integrated optical circuits suitable for applications in integrated biophotonics. The unique refractive index of CYTOP (n = 1.34) enables the cladding material to be well index-matched to an optically probed sample solution. Furthermore, ultra-high index contrast waveguides can be fa...

1998
ISRAEL KOREN

Current very-large-scale-integration (VLSI) technology allows the manufacture of large-area integrated circuits with submicrometer feature sizes, enabling designs with several millions of devices. However, imperfections in the fabrication process result in yield-reducing manufacturing defects, whose severity grows proportionally with the size and density of the chip. Consequently, the developme...

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