نتایج جستجو برای: scanning electron microscope sem

تعداد نتایج: 476330  

Journal: :Ultramicroscopy 2009
M R Went A Winkelmann M Vos

Diffraction patterns of backscattered electrons can provide important crystallographic information with high spatial resolution. Recently, the dynamical theory of electron diffraction was applied to reproduce in great detail backscattering patterns observed in the scanning electron microscope (SEM). However, a fully quantitative comparison of theory and experiment requires angle-resolved measur...

2007
Joon-Pyo Jeun Yun-Hye Kim Youn-Mook Lim Jae-Hak Choi Chan-Hee Jung Phil-Hyun Kang Young-Chang Nho

Electrospinning method was used to fabricate poly(L-lactide-co-D,L-lactide) (PLDLA) nanofiber non-woven membranes. The structure and morphology of the electrospun membranes were investigated by a scanning electron microscope (JEOL) after a gold coating. The diameter of the electrospun fiber was measured by Adobe Photoshop 5.0 software from the SEM pictures. SEM images showed that the fiber diam...

Journal: :Scanning 2000
W H Müller A C van Aelst B M Humbel T P van der Krift T Boekhout

Internal viewing of the cellular organization of hyphae by scanning electron microscopy is an alternative to observing sectioned fungal material with a transmission electron microscope. To study cytoplasmic organelles in the hyphal cells of fungi by SEM, colonies were chemically fixed with glutaraldehyde and osmium tetroxide and then immersed in dimethyl sulfoxide. Following this procedure, the...

2014
Lucille A. Giannuzzi L. A. Giannuzzi

In this paper, atomic number (Z) contrast from electron induced images is revisited. Z contrast obtained with a scanning electron microscope (SEM) is generally associated with the collection of backscattered electrons (BSEs) and is considered to exhibit a monotonic increase in BSE signal with Z [1]. However, there is no monotonic relationship of the backscattering coefficient, η, with Z at elec...

2015
Andrew F. Loftus Matthew S. Joens Sarah E. Dunn Michael W. Adams Chuong Huynh Bernhard Goetze James A.J. Fitzpatrick N. Torrey Pines

From plants to animals, the helium ion microscope (HIM) facilitates ultrastructural investigations of biological systems at both high contrast and resolution without the need for heavy metal coatings [1]. In this study, we describe not only the advantages of HIM over the low-voltage scanning electron microscopy (LV-SEM) of plant tissues, but will also demonstrate advances in preserving sub-nano...

2001
David C Joy

Current materials are usually complex in chemistry, three-dimensional in form, and of rapidly diminishing microstructural scale. To characterize such materials the scanning electron microscope (SEM) now uses a wide range of operating conditions to target the desired sample volume, sophisticated modeling techniques to interpret the data. It also uses novel imaging modes to derive new types of in...

2010
F. H. She W. M. Gao

Cross-linked poly(ethylene glycol) diacrylate (PEGDA) membranes were prepared by polymerization in periodic nanostructured lyotropic liquid crystals (LLC) hexagonal phases under UV light. A series of membranes were prepared under different purification treatment conditions. Polarized light microscope was employed to determine the LLC phase texture of LLC system before and after polymerization. ...

Journal: :Optics express 2004
P Pace Shane Huntington K Lyytikäinen A Roberts J Love

We show a quantitative connection between Refractive Index Profiles (RIP) and measurements made by an Atomic Force Microscope (AFM). Germanium doped fibers were chemically etched in hydrofluoric acid solution (HF) and the wet etching characteristics of germanium were studied using an AFM. The AFM profiles were compared to both a concentration profile of the preform determined using a Scanning E...

2006
Zenjiro Yajima Yoichi Kishi Ken’ichi Shimizu Hideharu Mochizuki Toshiki Yoshida

The relationship between the crack nucleation and stress-induced martensitic transformation in the retained massive austenites (RM’s) of austempered ductile irons (ADIs) was examined in detail by carrying out tensile tests and scanning electron microscope (SEM) observations for an ADI material. The SEM observations revealed that cracks were not nucleated in the peripheral regions of graphite no...

Journal: :Brazilian journal of biology = Revista brasleira de biologia 2007
S M Martín L H L Negrete

The radula of five species of South American Ampullariidae was analysed by Scanning Electron Microscope (SEM) with the purpose of enlarging new studies on the systematic of this family. The studied species were Pomacea canaliculata (Lamarck, 1822), Pomacea scalaris (d'Orbigny, 1835), Pomella (P.) megastoma (Gray, 1847), Asolene (A.) platae (Maton, 1809) and Felipponea neritiniformis (Dall, 1919...

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