نتایج جستجو برای: sem scale

تعداد نتایج: 638942  

2014
Antoine Vandecreme Peter Bajcsy Nicholas W.M. Ritchie John Henry J. Scott

Scanning electron microscopy with energy-dispersive X-ray spectrometry (SEM-EDS) was used to characterize a macroscopic artifact from Peru (a Moche cast figure) [1]. A 3D hyperspectral datacube was acquired over 51.2 hours, measuring 11,520 x 9,984 pixels with 2,048 energy channels per pixel; each pixel corresponds to 900 nm in the x and y dimensions. With current technology, interacting with t...

2006
R. Bouffanais E. Leriche M. O. Deville

We present the large-eddy simulation of the lid-driven cubic cavity flow by the spectral element method (SEM) using three subgrid-scale models. Two spectral filtering techniques suitable for these simulations have been implemented. Numerical results for Reynolds number Re = 12.000 are showing very good agreement with the Direct Numerical Simulation (DNS) results and relatively good agreement wi...

2006
Chengkang Chang Zhaoxin Yuan Dali Mao

This paper reports the detailed preparation process of Eu2+ activated long lasting Sr4Al14O25 nano sized phosphor by precipitation method. Scanning electron microscopy (SEM), simultaneous DSC–TG, X-ray diffraction (XRD), photo luminescent spectroscope (PLS) and thermal luminescent (TL) spectroscope were employed to characterize the phosphor. SrAl2O4:EuDy and Sr4Al14O25:EuDy phosphors in nano sc...

2014
BS Husebo R Ostelo LI Strand

BACKGROUND Mobilization-Observation-Behavior-Intensity-Dementia-2 (MOBID-2) pain scale is a staff-administered pain tool for patients with dementia. This study explores MOBID-2's test-retest reliability, measurement error and responsiveness to change. METHODS Analyses are based upon data from a cluster randomized trial including 352 patients with advanced dementia from 18 Norwegian nursing ho...

Journal: :Monções: Revista de Relações Internacionais da UFGD 2020

2007
C. Mathieu L Khouchaf A Kadoun

The high pressure SEM (HPSEM) is an important tool for materials characterisation. The presence of a gaseous atmosphere inside the specimen chamber permits to limit the charging effect and to obtain image with specific electron detector. The electron beam scattering due to the introduction of the gas within the specimen chamber of the HP-SEM influences the image quality and the microanalysis re...

Journal: :Estudos em Jornalismo e Mídia 2020

Journal: :Boletim do Centro de Pesquisa de Processamento de Alimentos 1990

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