نتایج جستجو برای: test design

تعداد نتایج: 1680057  

2006
Andrei S. Pavlov

Embedded SRAMs can occupy the majority of the chip area in SoCs. The increased process spreads of modern scaled-down technologies and non-catastrophic defect-related sensitivity to environmental parameters can compromise the stability of SRAM cells, which is quantified by a low Static Noise Margin (SNM). A Stability Fault (SF) can present itself in a cell whose SNM is so small that it can accid...

2007
Peter Lerchbaumer Alejandro Ochoa

The research in wireless communications and in-vehicle computing systems has opened up new fields of applications for transportation systems. Vehicular ad hoc networks (VANETs) emerge as a contribution to the solution of providing safer and more efficient roads and to increase passenger safety. This thesis treats different issues that influence the performance of wireless vehicle communication ...

2015
A. Burrill W. Anders A. Frahm F. Göbel J. Knobloch A. Neumann G. Ciovati P. Kneisel L. Turlington

The bERLinPro project, a 100 mA, 50 MeV superconducting RF (SRF) Energy Recovery Linac (ERL) is under construction at Helmholtz-Zentrum Berlin for the purpose of studying the technical challenges and physics of operating a high current, c.w., 1.3 GHz ERL. This machine will utilize three unique SRF cryomodules for the injector, booster and linac module respectively. The booster cryomodule will c...

2002
Norbert Felber Stephan Oetiker Thomas Villiger Frank Gürkaynak

2012
Takashi Kitamura Thi Bich Ngoc Do Hitoshi Ohsaki Ling Fang Shunsuke Yatabe

This paper proposes a test-case design method for black-box testing, called “Feature Oriented Testing (FOT)”. The method is realized by applying Feature Models (FMs) developed in software product line engineering to test-case designs. We develop a graphical language for test-case design called “Feature Trees for Testing (FTT)” based on FMs. To firmly underpin the method, we provide a formal sem...

2000
Jeroen Voeten Harald P. E. Vranken

An important aspect in the design of hardware/software systems is design-for-test. Improving the testability of a hardware/software system typically implies improving the controllability and observability of the internal system behavior. This can be achieved by introducing Points of Control and Observation (PCOs) in a system. In this paper, we examine the effects of PCO insertion in a behaviora...

1997
Peter Marwedel

| This tutorial responds to the rapidly increasing use of various cores for implementing systems-on-a-chip. It speci cally focusses on processor cores. We will give some examples of cores, including DSP cores and application-speci c instruction-set processors (ASIPs). We will mention market trends for these components, and we will touch design procedures, in particular the use compilers. Finall...

2011
Krishnendu Chakrabarty

IC AND SYSTEM designers continue to grapple with the challenges of ensuring high performance under tight power consumption constraints, escalating verification costs, and increasing test cost. The semiconductor industry is therefore seeking innovations to reduce design cost, design cycle time, and the cost associated with presilicon and postsilicon qualification. Solutions to these problems req...

2000
Yervant Zorian Erik Jan Marinissen Maurice Lousberg Sandeep Kumar Goel

A wrapper is a thin shell around the core, that provides the switching between functional, and core-internal and core-external test modes. Together with a test access mechanism (TAM), the core test wrapper forms the test access infrastructure to embedded reusable cores. Various company-internal as well as industry-wide standardized but scalable wrappers have been proposed. This paper deals with...

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