A low-overhead scheme for achieving complete (100%) fault coverage during built-in self test of circuits with scan is presented. It does not require modifying the function logic and does not degrade system performance (beyond using scan). Deterministic test cubes that detect the random-pattern-resistant (r.p.r.) faults are embedded in a pseudorandom sequence of bits generated by a linear feedba...

This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K to 800K gates, pose significant challenges to logic BIST methodology, flow, and tools. The paper presents the process of generating a BIST-compliant core along with the logic BIST controller for at-speed testing. Compar...

We present improvements of software development processes based on formalized functional requirements. Fundamental basis is a graphical formalism called simplified universal pattern allowing users to model requirements using the intrinsic nature of functional requirements specifying a trigger/action relation. The underlying graphical formalism enables to generate additional benefits to existing...

The code generator in a compiler attempts to match a subject tree against a collection of tree-shaped patterns for generating instructions. Tree-pattern matching may be considered as a generalization of string parsing. We propose a new generalized LR (GLR) parser, which extends the LR parser stack with a parser cactus. GLR explores all plausible parsing steps to find the least-cost matching. GL...

This paper presents a synthesisable VHDL model for a generalised multiplier capable of performing multiplication of both sign-magnitude and two’s complement operands. The multiplier is testable with a constant number of test vectors irrespective of operand word-lengths thereby reducing automatic test generation, simulation and testing times. The model has been used successfully for generating m...

Design patterns raise the abstraction level at which people design and communicate design of object-oriented software. But design patterns still leave the mechanics of their implementation to the programmer. This paper describes the architecture and implementation of a tool that automates the implementation of design patterns. The user of the tool supplies application-specific information for a...

purpose: the aim of this study is to analyze the theoretical foundations, the concept, documentation history, steps and the procedure of documentation of knowledge on the basis of life cycle of organizational knowledge and the introduction of automatic and semi-automatic operational strategies of the extraction of tacit knowledge and coding or the representation of explicit knowledge. methodolo...

Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, desig...

In this paper, we describe the Parameterized Reusable Component Library (PRCLIB) methodology, which supports design reuse automation. Unlike the Y-chart approach [2] which helps design space exploration at higher levels of abstraction, PRCLIB methodology addresses the issue of design space exploration at RTL levels. Although the methodology is developed keeping in mind Data Driven Media Process...

In this paper, we present a set of wavelet moment invariants, together with a discriminative feature selection method, for the classification of seemingly similar objects with subtle differences. These invariant features are selected automatically based on the discrimination measures defined for the invariant features. Using a minimum-distance classifier, our wavelet moment invariants achieved ...