نتایج جستجو برای: binning

تعداد نتایج: 1482  

Journal: :CoRR 2016
Michael T. McCann Matthew C. Fickus Jelena Kovacevic

We present a new smooth, Gaussian-like kernel that allows the kernel density estimate for an angular distribution to be exactly represented by a finite number of its Fourier series coefficients. Distributions of angular quantities, such as gradients, are a central part of several state-of-the-art image processing algorithms, but these distributions are usually described via histograms and there...

Journal: :Molecular biology and evolution 2007
Edward Susko Andrew J Roger

We investigate the use of Markov models of evolution for reduced amino acid alphabets or bins of amino acids. The use of reduced amino acid alphabets can ameliorate effects of model misspecification and saturation. We present algorithms for 2 different ways of automating the construction of bins: minimizing criteria based on properties of rate matrices and minimizing criteria based on propertie...

2009
Natasha Kholgade Andreas E. Savakis

In this paper, a four-dimensional spatiotemporal shape context descriptor is introduced and used for human activity recognition in video. The spatiotemporal shape context is computed on silhouette points by binning the magnitude and direction of motion at every point with respect to given vertex, in addition to the binning of radial displacement and angular offset associated with the standard 2...

Journal: :Psychophysiology 2010
Riccardo Poli Caterina Cinel Luca Citi Francisco Sepulveda

Stimulus-locked, response-locked, and ERP-locked averaging are effective methods for reducing artifacts in ERP analysis. However, they suffer from a magnifying-glass effect: they increase the resolution of specific ERPs at the cost of blurring other ERPs. Here we propose an extremely simple technique-binning trials based on response times and then averaging-which can significantly alleviate the...

2001
B. A. Peters J. S. Smith D. J. Medeiros Chad D. DeJong

Significant opportunities for improvement in semiconductor Assembly/Test (A/T) manufacturing reside in the Test areas. These Test areas can very often be the system constraint, due to complex testing policies, bin-to-order mapping, and cost. A very difficult problem for both researchers and manufacturers is to determine the best methods for assigning test programs for lots on these test equipme...

2005
PHILIP DAWID JULIA MORTERA

We study the problem of forensic identification when the trace evidence from the scene of the crime is imperfect: for example, it might be measured with error, or be partially missing. A general framework for imperfect data is developed, and applied in particular to the following cases, singly and in combination: 'measurement error' in the recorded information at the scene of the crime; 'binnin...

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