نتایج جستجو برای: by transition electron microscope tem various factors influencing

تعداد نتایج: 8064543  

Journal: :Journal of electron microscopy 2010
B Chayasombat T Kato T Hirayama T Tokunaga K Sasaki K Kuroda

Microstructures of oxide scales thermally formed on single-crystal silicon carbide were investigated using transmission electron microscopy. The oxide scales were formed on the Si-face of 6H-SiC at 1273-1473 K in dry oxygen. Spherical patterns were observed on the surfaces of the oxidized samples by an optical microscope in some regions. In these regions, cross-sectional transmission electron m...

Journal: :Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 1999
Isabell Fischione O'Keefe Guruz Dravid

: The effectiveness of applying a high-frequency, low-energy, reactive gas plasma for the removal of hydrocarbon contamination from specimens and components for electron microscopy has been investigated with a variety of analytical techniques. Transmission electron microscopy (TEM) analysis of specimens that have been plasma cleaned shows an elimination of the carbonaceous contamination from th...

Journal: :international journal of bio-inorganic hybrid nanomaterials 2015
a.a. dehno khalaji d. das j.s. matalobos f. gharib

in this paper, cubic nickel oxide nanoparticles were successfully prepared by solid-state thermal decomposition of nickel(ii) macrocyclic schiff-base complex at 450°c for 3 h without employing toxic solvent or surfactant and complicated equipment. nickel(ii) macrocyclic schiff-base complex was synthesized by the reaction of 1,2-bis(2-formyl-3-methoxyphenyl)propane, nicl2•6h2o and 1,3-phenylened...

2015
Suresh Kumar Vijaya Kumar Naraavula Suresh Kumar Katrapally Vijaya Kumar K. Vijaya Kumar

A series of Bismuth doped Cobalt nanoferrites of chemical composition CoBixFe2-xO4 (where x = 0.00, 0.05, 0.10, 0.15, 0.20 & 0.25) were prepared by sol-gel combustion method and calcinated at 600 ̊C. The structural and morphological studies were carried out by using X-ray diffraction (XRD), Scanning Electron Microscope (SEM), Transmission Electron Microscopy (TEM), Energy Dispersive Spectroscopy...

Journal: :Scanning 1997
J Pawley

This article traces the important milestones in the development of high-resolution, field-emission, scanning electron microscopes (SEM). Such instruments are now capable of producing images of the surfaces of biological specimens that rival, in terms of resolution and contrast, those produced by conventional transmission electron microscopy (TEM). Even though one of the first instruments to pro...

2014
N. J. Zaluzec A. Demortiere R. E. Cook R. E. Koritala J. G. Wen

As in-situ studies of dynamic processes in gases and liquids in the transmission and scanning transmission electron microscope (TEM/STEM) become routine [1] the need to go beyond imaging to more fully characterize complex microstructures during in-situ experiments becomes paramount. The use of both x-ray energy dispersive (XEDS) and electron loss spectroscopy (EELS) in conventional (vacuum) TEM...

2015
Jinxia Ma Zhiguo Wang Xiaofan Zhou Huining Xiao

A method for the production of paper with high strength and grease resistance was developed. Filter paper was impregnated by an aqueous solution of zinc chloride at a fixed temperature for several seconds. Swelling and partial dissolution of the cellulose fibers resulted in strong and compact paper. Various influencing factors were investigated in an attempt to improve the grease resistance of ...

Journal: :Applied and environmental microbiology 2004
Margaret C Henk

A method has been developed for collecting air-water interface (AWI) microbes and biofilms that enables analysis of the same sample with various combinations of bright-field and fluorescence light microscopy optics, scanning and transmission electron microscopy (TEM), and atomic force microscopy. The identical sample is then subjected to molecular analysis. The sampling tool consists of a micro...

Journal: :Micron 2008
Fabián Pérez-Willard Daniel Wolde-Giorgis Talaát Al-Kassab Gabriel A López Eric J Mittemeijer Reiner Kirchheim Dagmar Gerthsen

Needle-shaped atom probe specimens containing a single grain boundary were produced using the focused ion beam (FIB) of a two-beam FIB/SEM (scanning electron microscope) system. The presented specimen preparation approach allows the unprecedented study of a grain boundary which is well characterised in its crystallographic orientation by means of the field ion microscope (FIM) and the tomograph...

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