The development of VLSI technology results in the dramatically improvement of the performance of integrated circuits. However, it brings more challenges to the aspect of reliability. Integrated circuits become more susceptible to soft errors. Therefore, it is imperative to study the reliability of circuits under the soft error. This paper implements three probabilistic methods (two pass, error ...

The reliability of ADCs used in highly critical systems can be increased by applying a two-step procedure starting with sensitivity analysis followed by redesign. The sensitivity analysis is used to identify the most sensitive blocks which could then be redesigned for better reliability by incorporating fault tolerance. This paper illustrates the steps involved in incorporating fault tolerance ...

Reliability information provided by sets of orthogonal check sums in a majority logic decoder for block codes is used in a type-I hybrid ARQ error control scheme. The reliability information is obtained through a simple modification of the majority logic decoding rule. It is shown that the reliability performance of Reed-Muller and other majority logic decodable codes can be substantially impro...

As electronic devices are being scaled towards single digit nanometers, the frequency of errors that such nanocircuits will exhibit is expected to increase sharply. This is both a warning sign and a call to arms for including reliability/yield from the very early circuit design phases as a fourth optimization parameter (besides area, power and speed). In this paper we present an approach for re...

The scaling roadmap for realization of more than Moore in semiconductor industry has resulted in emergence of new types of devices, among them, memristive devices seem to be a promising candidate to be applied in various applications such as in memories and neuromorphic chips. However memristive devices face some challenges to be resolved before becoming a mainstream. This paper work analyzes t...

The reliability of ADCs used in highly critical systems can be increased by applying a two-step procedure starting with sensitivity analysis followed by redesign. The sensitivity analysis is used to identify the most sensitive blocks which could then be redesigned for better reliability by incorporating fault tolerance. This paper illustrates the steps involved in incorporating fault tolerance ...

Battery equalization can increase batteries’ life cycle, utilization, and reliability. Compared with battery equalization topologies based on resistance or energy storage components, the topologies based on transformers have the advantages of high balancing current and efficiency. However, the existence of switching losses will reduce the reliability and service life span of the equalization ci...

Cortical neurons often respond to identical sensory stimuli with large variability. However, under certain conditions, the same neurons can also respond highly reliably. The circuit mechanisms that contribute to this modulation, and their influence on behavior remains unknown. Here we used novel double transgenic mice, dual-wavelength calcium imaging and temporally selective optical perturbatio...

In this paper, the N2O plasma oxides in-situ grown on CF4 plasma pretreated silicon substrate is proposed and demonstrated having excellent characteristics. Those are precise thickness control, low temperature fabrication, low leakage current, and high reliability. Those good features will enhance the scaling down ability of CMOS devices. The mechanisms that make the process success are also di...

In order to meet the requirements for future satellite applications, a brassboard of an extremely reliable fault-tolerant spaceborne computer (FTSC) has been developed by Raytheon Co., Sudbury, MA., under the sponsorship of the USAF/SAMSO. The requirements for the FTSC were high reliability, high speed, low power, high density and tolerance to space radiation environments. The reliability requi...