نتایج جستجو برای: dielectric thin film

تعداد نتایج: 221297  

2011
Mai Xuan Dung Hyun-Dam Jeong

On the surface of mesoporous silica thin films (MSTF) which were fabricated by sol-gel approach there are existences of water and three different silanol types including chained, germinal and isolated silanol. Their amounts changes as a function of aging time of used sol solution, as confirmed by FT-IR. The adsorbed water generates ionic carriers such as H+ and OHand passivates the Si dangling ...

2006
J. Kuntner A. Jachimowicz F. Kohl B. Jakoby

The design and optimization of micromachined thermal sensors often requires information on accurate material properties of the used thin-films. These data can differ considerably from those stated for bulk matter and are strongly process-dependent. In this contribution a micromachined canitlever structure is proposed, which allows to directly determine the thermal conductivity of dielectric thi...

Journal: :J. Inform. and Commun. Convergence Engineering 2010
Chang-Wu Hur Kyu-Chung Lee

— Tantalum oxide (Ta 2 O 5) films are of considerable interest for a range of application, including optical waveguide devices, high temperature resistors, and oxygen sensors. In this paper, we establish an anode oxidation process of tantalum thin film. The voltage drop in the electrolyte is affected not in voltage change but in current change. If the voltage drop in the electrolyte is same wit...

2017
Dainan Zhang Miaoqing Wei Tianlong Wen Yulong Liao Lichuan Jin Jie Li Qiye Wen

MnZn ferrite thin films were deposited on p-Si substrate and used as the dielectric layer in the graphene field effect transistor for infrared and terahertz device applications. The conditions for MnZn ferrite thin film deposition were optimized before device fabrication. The infrared properties and terahertz wave modulation were studied at different gate voltage. The resistive and magnetic MnZ...

Journal: :Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2003
A C Diebold B Foran C Kisielowski D A Muller S J Pennycook E Principe S Stemmer

High-resolution transmission electron microscopy (HR-TEM) has been used as the ultimate method of thickness measurement for thin films. The appearance of phase contrast interference patterns in HR-TEM images has long been confused as the appearance of a crystal lattice by nonspecialists. Relatively easy to interpret crystal lattice images are now directly observed with the introduction of annul...

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