نتایج جستجو برای: failure cause

تعداد نتایج: 729436  

2011
Valeria V. Krzhizhanovskaya G. S. Shirshov N. B. Melnikova Robert G. Belleman F. I. Rusadi B. J. Broekhuijsen B. P. Gouldby J. Lhomme Bartosz Balis Marian Bubak Alexander L. Pyayt Ilya I. Mokhov A. V. Ozhigin Bernhard Lang Robert J. Meijer

We present a prototype of the flood early warning system (EWS) developed within the UrbanFlood FP7 project. The system monitors sensor networks installed in flood defenses (dikes, dams, embankments, etc.), detects sensor signal abnormalities, calculates dike failure probability, and simulates possible scenarios of dike breaching and flood propagation. All the relevant information and simulation...

2000
James C. M. Li Edward J. McCluskey

A tunneling-open failure mode is proposed and carefully studied. A circuit with a tunneling open could pass at-speed Boolean tests but fail VLV testing or I DDQ testing. Theoretical calculations as well as Boolean and I DDQ experiments confirm the existence of tunneling opens. The Murphy experimental data show that seven out of nine VLV-only failure circuits can be explained by this failure mod...

2003
Sammy Kayali

The utilization and application of commercially available semiconductor devices in high reliability spacesystems requires a thorough understanding of not only thereliability and failure mechanisms associated with the selecteddevices, but alsoof qualification and characterization methodsto determine the suitability of these devices to the intendedapplication. This paper p...

2016
Reuben M. Aronson Ankit Bhatia Zhenzhong Jia Mathieu Guillame-Bert David Bourne Artur Dubrawski Matthew T. Mason

Consumer electronic devices are made by the millions, and automating their production is a key manufacturing challenge. Fastening machine screws is among the most difficult components of this challenge. To accomplish this task with sufficient robustness for industry, detecting and recovering from failure is essential. We have built a robotic screwdriving system to collect data on this process. ...

2003
D. O'Brien

Existing information systems’ security measures are limited because even if a component failure due to an intrusion is detected, there are few mechanisms for effectively isolating the corrupt component. Attacks tend to spread unchecked, hopping from one host to another. The typical response, to turn off the corrupted service, results in denial of service that is often as damaging as the attack ...

Journal: :Microelectronics Reliability 2016
Ilyas Dchar Cyril Buttay Hervé Morel

Reliability is one of the key issues for the application of Silicon carbide (SiC) diode in high power conversion systems. For instance, in high voltage direct current (HVDC) converters, the devices can be submitted to high voltage transients which yield to avalanche. This paper presents the experimental evaluation of SiC diodes submitted to avalanche, and shows that the energy dissipation in th...

1988
Jayant Kalagnanam Max Henrion

There has long been debate about the relative merits of decision theoretic methods and heuristic rule­ based approaches for reasoning under uncertainty. We report an experimental comparison of the performance of the two approaches to troubleshooting, specifically to test selection for fault diagnosis. We use as experimental testbed the problem of diagnosing motorcycle engines. The first approac...

Journal: :Microelectronics Reliability 2012
Alberto Castellazzi Tsuyoshi Funaki Tsunenobu Kimoto Takashi Hikihara

Silicon carbide (SiC) power MOSFETs are characterised by potentially thermally unstable behaviour over a broad range of bias conditions. In the past, such behaviour has been shown for silicon (Si) MOSFETs to be related to a reduction of Safe Operating Area at higher drain–source bias voltages. For SiC MOSFETs no characterisation exists yet. This paper presents a thorough experimental investigat...

2003
F Z Fang H Wu X D Liu Y C Liu S T Ng

With the trend towards miniaturization, micromachining becomes more and more important in fabricating micro parts. Investigations have shown that unpredictable tool life and premature tool failure present a serious concern in micromachining. To further develop the process, a systematic study of various types of tool geometry has been carried out. The tool failure modes and the ways in which too...

1997
Chris J. Price Ian S. Pegler M. B. Ratcliffe A. McManus

This paper describes the dual use of a case base for diagnosis and for improving the design of a manufacturing process. In the short term, the case base is used to provide past experience in dealing with similar problems during the manufacture of aluminum components. In the longer term, it is used to feed that experience into the design of the manufacturing process for new components. This is a...

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