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In silico tools have been developed to predict variants that may have an impact on pre-mRNA splicing. The major limitation of the application of these tools to basic research and clinical practice is the difficulty in interpreting the output. Most tools only predict potential splice sites given a DNA sequence without measuring splicing signal changes caused by a variant. Another limitation is t...
Available online 13 February 2009
Multiple-inputmultiple-output (MIMO)detection algorithms have received considerable research interest in recent years, as a result of the increasing need for high data-rate communications. Detection techniques range from the low-complexity linear detectors to the maximum likelihood detector, which scales exponentially with the number of transmit antennas. In between these two extremes are the t...
We describe our experiences in using microelectronic design projects as cooperative education experiences for electrical engineering majors. We discuss funding of the necessary VLSI design laboratory and describe our course offerings. We believe our “alternative co-op” program is of value to VLSI educators with limited resources who are looking for ways to provide students with an alternative t...
Now, we come to offer you the right catalogues of book to open. applications of finite element methods for reliability studies on ulsi interconnections is one of the literary work in this world in suitable to be reading material. That's not only this book gives reference, but also it will show you the amazing benefits of reading a book. Developing your countless minds is needed; moreover you ar...
Timing Analysis and Optimization Techniques for VLSI Circuits
The layout design to improve uniform ESD current distribution in multi-finger MOSFET devices for better ESD robustness is investigated in a 0.18-μm salicided CMOS process. The multi-finger MOSFET, without adding the pick-up guard ring inserted into its source region, or with the vertical direction of power line connection, can sustain a higher ESD level. The layout of I/O cell can be drawn more...
An area-universal VLSI circuit can be programmed to emulate every circuit of a given area, but at the cost of lower area-time performance. In particular, if a circuit with area-time bounds (A; T ) is emulated with a universal circuit with bounds (Au; Tu); we say that the universal circuit has blowup Au=A and slowdown Tu=T . A central question in VLSI theory is to investigate the inherent costs ...
viiiAcknowledgments, vBibliography, 295Conclusion, 257Dedication, ivDesign Closure, 6Emerging Technologies, 197Introduction, 1Manufacturing Closure, 110
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