The atomic force microscope (AFM) is a versatile, high-resolution tool used to characterize the topography and material properties of a large variety of specimens at nano-scale. The interaction of the micro-cantilever tip with the specimen causes cantilever deflections that are measured by an optical sensing mechanism and subsequently utilized to construct the sample topography. Recent years ha...

The resonant frequency and sensitivity of an atomic force microscope (AFM) cantilever with assembled cantilever probe (ACP) have been analyzed and a closed-form expression for the sensitivity of vibration modes has been obtained. The proposed ACP comprises an inclined cantilever and extension, and a tip located at the free end of the extension, which makes the AFM capable of topography at sidew...

Title of dissertation: ADVANTAGEOUS UTILIZATION OF NONLINEAR PHENOMENA IN MICRO-STRUCTURES AND MACRO-STRUCTURES Andrew James Dick, Doctor of Philosophy, 2007 Dissertation directed by: Professor Balakumar Balachandran and Professor C. Daniel Mote, Jr. Department of Mechanical Engineering Within this work, the nonlinear oscillations of various beam-like structures are studied. Methods are develop...