Various types of Fault Current Limiters (FCLs) have been proposed and proven to offer numerous advantages with respect to transmission losses, voltage quality, and power system stability. However, FCL research has largely focused on only the FCL system, including optimization of components, efficiency improvement, and cost reduction. Conventional solutions to fault current problems, such as spl...

Simultaneous switching noise (SSN) has become an important issue in the design of the internal on-chip power distribution networks in current very large scale integration/ultra large scale integration (VLSI/ULSI) circuits. An inductive model is used to characterize the power supply rails when a transient current is generated by simultaneously switching the on-chip registers and logic gates in a...

This paper presents the results of resistive-open defect insertion in different locations of Infineon 0.13 μm embedded-SRAM with the main purpose of verifying the presence of dynamic faults. This study is based on the injection of resistive defects as their presence in VDSM technologies is more and more frequent. Electrical simulations have been performed to evaluate the effects of those defect...

This paper describes a method of developing a Defect Oriented Test (DOT) strategy by using Inductive Fault Analysis (IFA) and layout dependent fault models extracted from process defect statistics. The results of a quantitative prediction of the effectiveness of several test strategies, such as functional, IDDQ, and a low voltage power supply method, on a current-mode Digital to Analogue Conver...

We report remarkable photovoltaic effect in YBa2Cu3O6.96 (YBCO) ceramic between 50 and 300 K induced by blue-laser illumination, which is directly related to the superconductivity of YBCO and the YBCO-metallic electrode interface. There is a polarity reversal for the open circuit voltage Voc and short circuit current Isc when YBCO undergoes a transition from superconducting to resistive state. ...