نتایج جستجو برای: scanning probe microscope
تعداد نتایج: 272834 فیلتر نتایج به سال:
Epitaxial graphene (EG) grown on an annealed 6H-SiC(0001) surface has been studied under ultra-high vacuum (UHV) conditions by using a combined dynamic-scanning tunneling microscope/frequency modulation-atomic force microscope (dynamic-STM/FM-AFM) platform based on a qPlus probe. STM and AFM images independently recorded present the same hexagonal lattice of bumps with a 1.9 nm lattice period, ...
This paper describes a detailed computational model of the interaction between an atomic force microscope probe tip and a sample surface. The model provides analyses of dynamic behaviors of the tip to estimate the probe deflections due to surface intermittent contact and the resulting dimensional biases and uncertainties. Probe tip and cantilever beam responses to intermittent contact between t...
The contrast in atomic force microscope images arises from forces between the tip and the sample. It was shown recently that specific molecular interaction forces may be measured with the atomic force microscope; consequently, we use such forces to map the distribution of binding partners on samples. Here we demonstrate this concept by imaging a streptavidin pattern with a biotinylated tip in a...
Simple feedforward ideas are shown to lead to a nearly tenfold increase in the effective bandwidth of a closed-loop piezoelectric positioning stage used in scanning probe microscopy. If the desired control signal is known in advance, the feedforward filter can be acausal: the information about the future can be used to make the output of the stage have almost no phase lag with respect to the in...
background of the study: colorectal cancer (crc) which is the third most diagnosed cancer throughout the world is steadily rising in the asian countries with the incidence rates mimicking the western counterparts. the pre-neoplastic nature of the transitional mucosa (tm) adjoining crc lacks conclusive evidence so far. pertaining to this, the study of the mucus layer, the functional component of...
Scanning probe microscopy techniques (SPM) have been applied to a rapidly improvement in the characterization of metal oxide nanocrystalline. These materials are widely used in photon-to-electricity conversion devices, such as dye-sensitized solar cells. The surface properties of such nanocrystalline determine the devices’ performance. SPM imaging of nanocrystal surfaces and nanoscale systems h...
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