نتایج جستجو برای: single error upset seu
تعداد نتایج: 1116761 فیلتر نتایج به سال:
This paper discusses high level techniques for designing fault tolerant systems in SRAM-based FPGAs, without modification in the FPGA architecture. TMR has been successfully applied in FPGAs to mitigate transient faults, which are likely to occur in space applications. However, TMR comes with high area and power dissipation penalties. The new technique proposed in this paper was specifically de...
Abstract We present a design technique, Partial evaluation-based Triple Modular Redundancy (PTMR), for hardening combinational circuits against Single Event Upsets (SEU). The basic ideas of partial redundancy and temporal TMR are used together to harden the circuit SEUs. concept is eliminate gates whose outputs can be determined in advance. have designed fault insertion simulator evaluate techn...
Experimental and theoretical analysis has shown that the conventional expected utility (EU) and subjective expected utility (SEU) models, which are linear in probabilities, have serious limitations in certain situations. We argue here that these limitations are often highly relevant to the work that environmental and natural resource economists do. We discuss some of the experimental evidence a...
With aggressive scaling of transistor size and supply voltage, the critical charge sensitive nodes is reducing rapidly. As a result, when these deep submicron devices are used in memory cells space environment, single-event upsets (SEUs), also known as soft-errors, pose great threat to reliability cells. To mitigate effects SEUs, we propose soft-error-immune read-stability-improved (SIRI) SRAM ...
Germanium is potentially candidate to replace silicon in ultra-scaled transistors. This work analyses the radiation response of germanium thin layer subjected atmospheric neutrons simulated with Geant4 and quantifies underlying mechanisms responsible single event effects Ge-based CMOS technologies. From this analysis interactions at material-level, reliability assessments for nanoelectronics ar...
Genetic and physiological analyses implicate auxin flux in patterning, initiation and growth of floral organs. Within the Arabidopsis flower, the ETTIN/ARF3 transcription factor responds to auxin to effect perianth organ number and reproductive organ differentiation. This work describes a modifier of ettin that causes filamentous, mispositioned outer whorl organs and reduced numbers of malforme...
The Reconfiguration for Reliability: Application of partial reconfiguration, exploiting the benefits of on-line fault detection to identify the occurrence of a SEU; such information is used to localize the portion of the FPGA to be re-configured to recover from the error by dynamically performing partial reconfiguration. All information on fault localization and the part to be re-configured are...
Understanding the SEU induced failure modes specific to the Virtex SRAM FPGA is needed to evaluate the applicability of various mitigation schemes since many mitigation approaches were originally intended for ASICs and may not be effective or efficient within FPGAs due to the unique failure modes and architectures found in SRAM-based FPGAs. Through this work, we have shown that SEUs in FPGAs’ p...
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