نتایج جستجو برای: test equipment

تعداد نتایج: 879736  

Journal: :IOP Conference Series: Earth and Environmental Science 2017

Journal: :Journal of the Korea Academia-Industrial cooperation Society 2014

Journal: : 2021

An analysis of modern testing equipment to establish the mechanical properties different in structure and origin building materials. As a result, it was established, that most effective for are foreign electromechanical servo-hydraulic machines configurations. It is determined this type technical systems allows study types materials, including high-strength, compressive, tensile, bending other ...

2014
Alicia M. Volpicelli Alicia Marina Volpicelli Manon Whittlesey Leila Roy

The design of released microstructures depends on accurate knowledge of residual stresses and associated elastic constants. The MIT-developed material test procedure, M-Test, uses the variation of pull-in voltage with beam length to extract residual stress and elastic modulus from in-situ test structures. This thesis reports a fully automated computer-microvision procedure that automatically de...

Journal: :IEICE Transactions 2014
Wanbin Ren Yu Chen Shengjun Xue Guenther Horn Guofu Zhai

There has been increasing demand to research the measuring method to characterize the batch consistency of contact rivets. An automated test equipment has been described that makes it possible to measure the electrical contact resistance with high efficiency. The relationship between contact force and contact resistance during the loading and unloading process was measured explicitly using AgPd...

Journal: :Aviation, space, and environmental medicine 1989
G W Mitchell J E Adams

Medical equipment is necessary to support patients requiring air transportation, but it may not be compatible with the aviation environment. Aircraft systems may cause errors in the functioning of medical equipment, or that equipment may interfere with the aircraft. Medical equipment has been tested, primarily for fixed wing aircraft, to military standards by the U.S. Air Force. This study repo...

2001
B. A. Peters J. S. Smith D. J. Medeiros Chad D. DeJong

Significant opportunities for improvement in semiconductor Assembly/Test (A/T) manufacturing reside in the Test areas. These Test areas can very often be the system constraint, due to complex testing policies, bin-to-order mapping, and cost. A very difficult problem for both researchers and manufacturers is to determine the best methods for assigning test programs for lots on these test equipme...

Journal: :Periodica Polytechnica Mechanical Engineering 2013

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