We study the spatial distribution of a 95% complete sample of 508 X-ray point sources (XPS) detected in the 0.5–2.0 keV band in Chandra ACIS-I observations of 51 massive galaxy clusters found in the MACS survey. Covering the redshift range z = 0.3 − 0.7, our cluster sample is statistically complete and comprises all MACS clusters with X-ray luminosities in excess of 4.5 × 10 erg s (0.1–2.4 keV,...

Epitaxial VxMo(1-x)Ny thin films grown by ultrahigh vacuum reactive magnetron sputter deposition on MgO(001) substrates are analyzed by x-ray photoelectron spectroscopy (XPS). This contribution presents analytical results for 300-nm-thick single-crystal V0.47Mo0.53N0.92/MgO(001) films deposited by reactive cosputtering from V (99.95% purity) and Mo (99.95% purity) targets. Film growth is carrie...

A broad attention has been paid to the field ditches as the sewage interception channel for the agricultural nonpoint source pollution, however, rare studies have involved in the phosphorus migration and transformation between the ditch sediments and overlaying water, especially, from the ditch sediments to the water. The present paper aims to explore with XPS binding energy data how pH, dissol...

The first comprehensive investigation of the effect of conformational flexibility of gaseous D-cycloserine on the valence and core electronic structures is reported here. The seven most stable conformers among the twelve structures calculated at the MP2/6-311++G** level of theory were assumed to properly describe the properties of the investigated compound. Taking into account the contribution ...

VxMo(1-x)Ny thin films grown by ultrahigh vacuum reactive magnetron sputter deposition on MgO(001) substrates are analyzed by x-ray photoelectron spectroscopy (XPS). This contribution presents analytical results for 300-nm-thick 002-textured polycrystalline V0.49Mo0.51N1.02 films deposited by reactive cosputtering from V (99.95 % purity) and Mo (99.95 % purity) targets. Film growth is carried o...

Combining functional organic self-assembled monolayers (SAMs) with conventional semiconductor materials is a key step in the development of integrated electronics-based devices. T-BAG (Tethering by Aggregation and Growth) has been shown to be a simple and reliable method to grow SAMs of alkylphosphonates on oxide surfaces. However, distinguishing SAMs from ultra-thin multilayers is a challenge ...