نتایج جستجو برای: built forms

تعداد نتایج: 373378  

Journal: :ISPRS Annals of the Photogrammetry, Remote Sensing and Spatial Information Sciences 2020

Journal: :معماری و شهرسازی 0
جهانشاه پاکزاد استاد دانشکده معماری و شهرسازی، دانشگاه شهید بهشتی، تهران الهه ساکی کارشناس ارشد طراحی شهری، دانشکده معماری و شهرسازی، دانشگاه شهید بهشتی، تهران

throughout human evolution history, beauty has always been one of the necessary integral components of human need. as greer (2010) said, “one of the prehistoric human’s responses to the animal life around them was to etch and paint these animals on the walls of their caves. turning them into art and rendering them beautiful was a natural response - a way to help make sense of a hostile and conf...

Journal: :international journal of architecture and urban development 0
rahman tafahomi hasanuddinn lamit

the aim of this paper is to review the created problems and failure of environmental design patterns in designing process by designers. not respectfully addressing the context of environment during designing process have resulted in the loss quality of environment, damage to both nature and essence of environment as manifested in the case study area. methodology of the research was based on the...

Hasanuddinn Lamit Rahman Tafahomi

The aim of this paper is to review the created problems and failure of environmental design patterns in designing process by designers. Not respectfully addressing the context of environment during designing process have resulted in the loss quality of environment, damage to both nature and essence of environment as manifested in the case study area. Methodology of the research was based on the...

Journal: :J. Electronic Testing 1996
Ioannis Voyiatzis Antonis M. Paschalis Dimitris Nikolos Constantin Halatsis

Single Input Change (SIC) testing has been proposed for robust path delay fault testing. In this letter a new Built-In Self Test (BIST) method for SIC vector generation is presented. The proposed method compares favourably to the previously proposed methods for SIC pattern generation with respect to hardware overhead and time required for completion of the test.

1995
Ioannis Voyiatzis Dimitris Nikolos Antonis M. Paschalis Constantin Halatsis Themistoklis Haniotakis

2003
Ahmad A. Al-Yamani Edward J. McCluskey

Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost, testing using automatic test equipment (ATE) makes it hard to test the circuit while in the system. In this paper, we present a technique for built-in reseeding. Our technique requires no storage for the seeds. The s...

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