نتایج جستجو برای: can technique

تعداد نتایج: 3162538  

Journal: :Journal of Systems Architecture 2016

Journal: :The journal of physical chemistry. B 2005
Jing Guo Norbert Koch Jeffrey Schwartz Steven L Bernasek

Tin complexes of phenoxide ligands having a range of dipole moments were prepared on the surface of indium-tin oxide (ITO). Surface complex loadings and stoichiometries were measured by quartz crystal microgravimetry. Work functions of ITO substrates treated with these various surface complexes were measured using a Kelvin probe. Surface complex dipole moments were then calculated based on meas...

Journal: :Systematic biology 1999
J B Slowinski B S Arbogast

The wealth of molecular data generated over the past two decades has led to the documentation of highly disparate rates of molecular evolution among different taxa. Among the more intriguing studies is that of Martin and Palumbi (1993), who presented data (their Table 2) derived from a variety of vertebrate taxa purporting to show that the rate of molecular evolution is inversely correlated wit...

2015
Elviz George Abhijit Dasgupta

Title of Document: A NON-LINEAR DAMAGE MODEL WITH LOAD DEPENDENT EXPONENTS FOR SOLDERS UNDER SEQUENTIAL CYCLIC SHEAR LOADS Elviz George, Ph.D., 2015 Directed By: Professor Michael G. Pecht, Department of Mechanical Engineering The damage state of a material subject to cyclic loads is often characterized by the cycle ratio of applied cycles to the number of survivable cycles. The damage in a mat...

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه گیلان - دانشکده علوم انسانی 1391

the present study sought to investigate the impact of using mind-mapping technique instruction on female elementary efl learners reading comprehension; it also investigated their attitudes towards using mind-mapping technique as a tool to improve their reading comprehension. this study followed a quasi-experimental design with two intact groups as experimental, and control groups. the participa...

Journal: :Scilight 2023

Heat wave method helps locate the high stress regions in electronics that are susceptible to radiation damage.

Journal: :European Scientific Journal ESJ 2019

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