Thick matrices of fibrinogen with incorporation of a matrix metalloproteinase inhibitor were covalently bonded on functionalized silicon surfaces using an ethyl-3-dimethyl-aminopropyl-carbodiimide and N-hydroxy-succinimide affinity ligand coupling chemistry. The growth of the structure was followed in situ using dynamic ellipsometry and characterized at steady-state with spectroscopic ellipsome...

We present complex refractive index measurements of Pd and Pt films from 700-1700nm using variable angle spectroscopic ellipsometry. Refractive index changes upon H2 gas adsorption were determined by measuring normal incidence reflection and transmission. Keywords-ellipsometry, refractive index, extinction coefficient, thin film, palladium, platinum, hydrogen, gas sensors

Spectroscopic ellipsometry together with an effective medium model is used to determine simultaneously the effective refractive index, thickness, and metal volume fraction of thin nanocomposite films. The films are formed by Bi nanocrystals embedded in amorphous matrices, either semiconducting ~Ge! or dielectric (Al2O3). For the Bi:Ge films ~metal in an absorbing host!, the values obtained for ...

The competitive adsorption of collagen and bovine serum albumin (BSA) on surfaces with varied wettability was investigated with imaging ellipsometry, and ellipsometry. Silane modified silicon surfaces were used as substrates. The results showed that surface wettability had an important effect on protein competitive adsorption. With the decrease of surface wettability, the adsorption of collagen...

Variable angle spectroscopic ellipsometry is a nondestructive technique for accurately determining the thicknesses and refractive indices of thin films. Experimentally, the ellipsometry parameters psi and Delta are measured, and the sample structure is then determined by one of a variety of approaches, depending on the number of unknown variables. The ellipsometry parameters have been inverted ...

Optical determination of shallow carrier profiles using Fourier transform infrared ellipsometry" (1998). Faculty Publications from the Department of Electrical and Computer Engineering. 23. Dopant profiles were determined by ex situ Fourier transform infrared variable-angle spectroscopic ellipsometry. The technique exploits carrier absorption in the mid-infrared spectral range and combines the ...

A new application of infrared ellipsometry is reported. Specifically, the interdiffusion between thin films of miscible polymers (poly(methyl methacrylate) and poly(vinylidene fluoride)) is detected in a non-invasive measurement. A novel technique of data analysis for interdiffusion was developed and is described. The validity of the approach is supported by simulations of diffusion in a bilaye...

Control of liquid crystal (LC) orientation using a proper SiO2 alignment layer is essential for the optimization of vertically aligned nematic (VAN) displays. With this aim, we studied the optical anisotropy of thin SiO2 films by generalized ellipsometry as a function of deposition angle. The columnar SiO2 structure orientation measured by a noninvasive ellipsometry technique is reported for th...