نتایج جستجو برای: epitaxial

تعداد نتایج: 9450  

Fadavieslam, , Kazemi, , Yazdi, ,

In this work, the effect of doping Graphene Quantum Dots (GQDs) on their emission spectra has been studied. First, graphene has been deposited on SiC substrate by using sublimation method. Second, doped-GQDs have been distributed on the surface of graphene via drop casting. The structure of the samples have been studied and characterized by X-ray diffraction (XRD), Scanning Electron Microscopy ...

2016
Wenliang Wang Haiyan Wang Weijia Yang Yunnong Zhu Guoqiang Li

High-quality GaN epitaxial films have been grown on Si substrates with Al buffer layer by the combination of molecular beam epitaxy (MBE) and pulsed laser deposition (PLD) technologies. MBE is used to grow Al buffer layer at first, and then PLD is deployed to grow GaN epitaxial films on the Al buffer layer. The surface morphology, crystalline quality, and interfacial property of as-grown GaN ep...

2003
M. S. Mason C. M. Chen H. A. Atwater Thomas J. Watson

We investigate low-temperature epitaxial growth of thin silicon films by HWCVD on Si w1 0 0x substrates and polycrystalline template layers formed by selective nucleation and solid phase epitaxy (SNSPE). We have grown 300-nm thick epitaxial layers at 300 8C on silicon w1 0 0x substrates using a high H :SiH ratio of 70:1. Transmission electron microscopy confirms that the 2 4 films are epitaxial...

2013
Yuan-Chang Liang Hua Zhong Wen-Kai Liao

(La,Sr)MnO3 (LSMO) nanolayers with various crystallographic textures were grown on the sapphire substrate with and without In2O3 epitaxial buffering. The LSMO nanolayer with In2O3 epitaxial buffering has a (110) preferred orientation. However, the nanolayer without buffering shows a highly (100)-oriented texture. Detailed microstructure analyses show that the LSMO nanolayer with In2O3 epitaxial...

2013
P. Roca i Cabarrocas R. Cariou

We report on the epitaxial growth of crystalline silicon films on (100) oriented crystalline silicon substrates by standard plasma enhanced chemical vapor deposition at 175 °C. Such unexpected epitaxial growth is discussed in the context of deposition processes of silicon thin films, based on silicon radicals and nanocrystals. Our results are supported by previous studies on plasma synthesis of...

2005
Christine Esber Richardson Brendan M. Kayes Matthew J. Dicken Harry A. Atwater Thomas J. Watson

We have investigated the low-temperature epitaxial growth of thin silicon films by hotwire chemical vapor deposition (HWCVD). Using reflection high energy electron diffraction (RHEED) and transmission electron microscopy (TEM), we have found conditions for epitaxial growth at low temperatures achieving twinned epitaxial growth up to 6.8 μm on Si(100) substrates at a substrate temperature of 230...

2013
S. Chakraborty R. Cariou M. Labrune P. Roca i Cabarrocas P. Chatterjee

We have previously reported on the successful deposition of heterojunction solar cells whose thin intrinsic crystalline absorber layer is grown using the standard radio frequency plasma enhanced chemical vapour deposition process at 165 ◦C on highly doped P-type (100) crystalline silicon substrates. The structure had an N-doped hydrogenated amorphous silicon emitter deposited on top of the intr...

2013
Weichung Wang Jack Denton Gerold W. Neudeck

..................................................................................................................... x CHAPTER 1 : INTRODUCTION .................................................................................... 1 ................................................................................................ 1.1 Purpose of Work 1 .................................................

2013
R. Cariou R. Ruggeri

Low temperature plasma processes provide a toolbox for etching, texturing and deposition of a wide range of materials. Here we present a bottom up approach to grow epitaxial crystalline silicon films (epi-Si) by standard RFPECVD at temperatures below 200°C. Booth structural and electronic properties of the epitaxial layers are investigated. Proof of high crystalline quality is deduced from spec...

2000
R. B. Andersen T. Jørgensen S. Laursen T. E. Kolding

A 2.5D EM-simulator has been used to study how planar inductor performance is influenced by an epitaxial substrate. The simulation model used has been adjusted and verified by measurements on an octagonal inductor fabricated in a submicron CMOS technology. The impact of the epitaxial layer has been studied by sweeping it’s permittivity, thickness, and resistivity. The results show that typical ...

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