The density and intermolecular structure of water in carbon micropores (w = 1.36 nm) are investigated by small-angle X-ray scattering (SAXS) and X-ray diffraction (XRD) measurements between 20 K and 298 K. The SAXS results suggest that the density of the water in the micropores increased with increasing temperature over a wide temperature range (20-277 K). The density changed by 10%, which is c...

OBJECTIVES It is important to characterize the surface of dental amalgam in order to understand the process of mercury release from amalgam restorations in the oral cavity. The mercury evaporation occurs not only from the newly made restoration but also from the set material. METHODS The surfaces of four different types of amalgams, which had been well set, were analyzed with X-ray photoelect...

In this paper, we propose a novel 4D model-based iterative reconstruction (MBIR) algorithm for low-angle scatter X-ray Diffraction (XRD) that can substantially increase the SNR. Our forward model is based on a Poisson photon counting model that incorporates a spatial point-spread function, detector energy response and energy-dependent attenuation correction. Our prior model uses a Markov random...

We have discussed a new crystal epitaxial lateral overgrowth (ELO) method, partly-contacted ELO (PC-ELO) method, of which the overgrowth layer partly-contacts with underlying seed layer. The passage also illustrates special mask structures with and without lithography and provides three essential conditions to achieve the PC-ELO method. What is remarkable in PC-ELO method is that the tilt angle...

The syntheses of thermally stable chromium-incorporating hexagonal mesoporous aluminophosphate and cubic Cr-MCM-48 have been reported. Characterization of the catalysts was made using low angle XRD, N2 adsorption, UV-VISDRS, thermal analysis, ICP-AES and ESR. Mesoporous Cr-AlPO4 and Cr-MCM-48 catalysts have been found to be active for the vapour phase oxidation of toluene with molecular oxygen....

GaN films grown on PSS are investigated by XRD, CL, SEM and TEM. There are low threading dislocations (TDs) with larger fill factor, which results in better electrostatic discharge (ESD) yield of LEDs. The effect of growth rate on dislocations in GaN films grown on PSS is investigated by TEM. It is found that dislocations density decreases as the growth rates decrease. And the performance of In...

We report temperature and thermal-cycling dependence of surface and bulk structures of double-layered perovskite Sr3Ru2O7 single crystals. The surface and bulk structures were investigated using low-energy electron diffraction LEED and single-crystal x-ray diffraction XRD techniques, respectively. Single-crystal XRD data is in good agreement with previous reports for the bulk structure with RuO...

A test bench instrument constructed at MOXTEK, Inc. is capable of simultaneously capturing X-ray diffraction (XRD) and X-ray fluorescence (XRF) information using a charge-coupled device (CCD) as the X-ray detector. NASA is funding the instrument’s construction because of its low-power consumption and compact size; it could be used for in-situ planetary exploration missions for mineral analysis....

X-ray diffraction (XRD) analysis is a fundamental method to evaluate the carbon stacking structure in coal and carbon materials. However, the vagueness of XRD pattern of coal, which has the low crystallinity, often makes it difficult to evaluate the stacking structure quantitatively. In a previous study [1,2], we reported the standard analysis of carbon stacking structure in coal by XRD techniq...