نتایج جستجو برای: ray diffractometer

تعداد نتایج: 303427  

Journal: :Journal of synchrotron radiation 2012
Thomas Arnold Chris Nicklin Jonathan Rawle John Sutter Trevor Bates Brian Nutter Gary McIntyre Martin Burt

X-ray optics, based on a double-crystal deflection scheme, that enable reflectivity measurements from liquid surfaces/interfaces have been designed, built and commissioned on beamline I07 at Diamond Light Source. This system is able to deflect the beam onto a fixed sample position located at the centre of a five-circle diffractometer. Thus the incident angle can be easily varied without moving ...

Journal: :Journal of The Adhesion Society of Japan 2008

Journal: :Acta crystallographica. Section F, Structural biology communications 2017
Charline J J Gerard Gilles Ferry Laurent M Vuillard Jean A Boutin Leonard M G Chavas Tiphaine Huet Nathalie Ferte Romain Grossier Nadine Candoni Stéphane Veesler

A microfluidic platform was used to address the problems of obtaining diffraction-quality crystals and crystal handling during transfer to the X-ray diffractometer. Crystallization conditions of a protein of pharmaceutical interest were optimized and X-ray data were collected both in situ and ex situ.

2017
Thomas Harmening Adel F. Al Alam Samir F. Matar Helmut Eckert Rainer Pöttgen Adel Al Alam Hellmut Eckert

The silicide Sc2RuSi2 was synthesized from the elements by arc-melting. The structure was refined on the basis of single crystal X-ray diffractometer data: Sc2CoSi2 type, * Manuscript Click here to view linked References

Journal: :Chemical communications 2010
Seok Min Yoon Hyun Jae Song In-Chul Hwang Kwang S Kim Hee Cheul Choi

The single crystal structure of a micrometre-scale copper hexadecafluoro-phthalocyanine (F(16)CuPc) ribbon synthesized by vaporization-condensation-recrystallization (VCR) process was resolved by using a synchrotron X-ray diffractometer.

2001
SHIGERU MUNEKAWA

generally arranged at a distance of 0.1 nm to 0.5 nm from one another. When such a substance is irradiated with X-rays having a wavelength roughly equivalent to the interatomic or intermolecular distance, the Xray diffraction phenomenon will take place. X-ray diffraction is widely used in the semiconductor field because it is nondestructive and yields crystal structure information relatively ea...

Journal: :Journal of Applied Crystallography 2013

Journal: :Journal of the Society of Materials Science, Japan 1965

2000
Jimpei Harada

A high-intensity grazing-incidence X-ray diffractometer system, which uses a parabolic graded multilayer mirror and an 18-kW rotating-anode generator, has recently been developed for the structural characterization of surfaces and thin film~. Its goniometer has two in-plane tp/20 x axes and two conventional m¢20 axes for measurements of in-plane and out-of-plane diffraction, respectively. The d...

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