A new type of scanning probe microscope, combining features of the scanning tunnelling microscope, the scanning tunnelling luminescence microscope with a transparent probe and the aperture scanning near-field optical microscope, is described. Proof-of-concept experiments were performed under ultrahigh vacuum conditions at varying temperature on GaAs/AlAs heterostructures.

Scanning probe microscopes are widely used to study surfaces with atomic resolution in many areas of nanoscience. Ultracold atomic gases trapped in electromagnetic potentials can be used to study electromagnetic interactions between the atoms and nearby surfaces in chip-based systems. Here we demonstrate a new type of scanning probe microscope that combines these two areas of research by using ...

Reproducible scanning tunneling microscope and atomic force microscope images of entire molecules of uncoated plasmid DNA chemically bound to surfaces are presented. The chemically mediated immobilization of DNA to surfaces and subsequent scanning tunneling microscope imaging of DNA molecules demonstrate that the problem of molecular instability to forces exerted by the probe tip, inherent with...

scanning hall probe microscopy (shpm) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. this method is based on application of the hall effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  shpm provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for dail...

A combined scanning probe microscope has been developed that allows simultaneous operation as a non-contact/tapping mode atomic force microscope, a scattering near-field optical microscope, and a scanning tunnelling microscope on conductive samples. The instrument is based on a commercial optical microscope. It operates with etched tungsten tips and exploits a tuning fork detection system for t...

Non-contact Atomic ForceMicroscopy (NC-AFM) is an experimental technique capable of imaging almost any surface with atomic resolution, in a wide variety of environments. Linking measured images to real understanding of system properties is often difficult, and many studies combine experiments with detailedmodelling, in particular using virtual simulators to directlymimic experimental operation....