Scanning mode is a key factor for the comprehensive performance, including imaging efficiency, of scanning transmission X-ray microscopy (STXM). Herein presented bidirectional method designed STXM with an S-shaped moving track. In this method, artificially ramp waves are generated by piezo-stage controller to control two-dimensional sample. The sample position information measured using laser i...

Abstract Performance, usability, and even availability of 4D-scanning transmission electron microscopy (STEM) measurements have historically been compromised by the lack integration 4D-STEM components on (S)TEM columns that were not originally designed for this purpose. This article introduces TESCAN TENSOR, world’s first dedicated instrument multimodal characterization nanoscale morphological,...