نتایج جستجو برای: v shaped cantilever

تعداد نتایج: 376036  

Journal: :Dalton transactions 2010
Huaqiao Tan Weilin Chen Ding Liu Yangguang Li Enbo Wang

Two new cantilever-type polyoxometalates Na(5)(NH(4)){V(IV)[(Mo(2)O(6))CH(3)C(O)(PO(3))(2)](2)}.13H(2)O (1) and (NH(4))(4){V(IV)[(Mo(2)O(6))NH(3)CH(2)CH(2)CH(2)C(O)(PO(3))(2)](2)}.6H(2)O (2) have been synthesized and characterized by IR spectroscopy, UV-visible spectroscopy, elemental analysis, TG analysis, XPS, (31)P NMR and single-crystal X-ray diffraction. The structure analysis reveals that...

Journal: :Ultramicroscopy 2001
R W Stark T Drobek W M Heckl

We have calculated the thermal noise of a v-shaped AFM cantilever (Microlever, Type E, Thermomicroscopes) by means of a finite element analysis. The modal shapes of the first 10 eigenmodes are displayed as well as the numerical constants, which are needed for the calibration using the thermal noise method. In the first eigenmode, values for the thermomechanical noise of the z-displacement at 22...

The most promising method for micro scale energy scavenging is via vibration energy harvesting which converts mechanical energy to electrical energy. Using piezoelectric cantilevers is the most common method for vibration energy harvesting. Changing the shape of the cantilevers can lead to changing the generated output voltage and power. In this work vibration energy harvesting via piezoelectri...

A. H. Korayem A. K. Hoshiar M. H. Korayem S. Badrlou

   During past decade the AFM based nanomanipulation has been focus of attention as the promising nano fabrication approach. The main challenge in this process is the real-time monitoring. Consequently, the dynamic models have been proposed as a solution to the existing challenge. In the modeling approach the magnitudes of the forces are proportional to the stiffness coefficients o...

A. Karimi M. H. Korayem S. Sadeghzadeh

V-shaped and triangular cantilevers are widely employed in atomic force microscope (AFM) imaging techniques due to their stability. For the design of vibration control systems of AFM cantilevers which utilize patched piezo actuators, obtaining an accurate system model is indispensable prior to acquiring the information related to natural modes. A general differential quadrature element method (...

Journal: :Physical chemistry chemical physics : PCCP 2009
C L Henry V S J Craig

We report measurements of slip length at smooth and rough hydrophilic silica surfaces, using the hydrodynamic force measurement atomic force microscope (AFM). There has been some debate in the literature as to whether the boundary condition between a solid and a wetting fluid is one of no-slip or partial-slip; in particular the results of Neto et al. (C. Neto, V. S. J. Craig and D. R. M. Willia...

2004
S Deladi M C Elwenspoek

We present the fabrication process of a tool that can be used in standard atomic force microscope (AFM) for in situ characterization of chemical, chemical–mechanical or physical surface modification performed with the same device. The image obtained during scanning contains information about the modified and unmodified topographies for each scanning line, thus quantification of surface topograp...

2000
R Bashir

In this paper, the design of silicon based cantilevers for scanning probe microscopy has been described in detail. ANSYS software has been used as a tool to design and model the mechanical properties of the silicon based cantilevers. The incorporation of stress concentration regions (SCRs) with a thickness smaller than the cantilever thickness, to localize stresses, has been explored in detail ...

2001
M Maaloum

Knowledge of the interaction forces between surfaces gained using an atomic force microscope (AFM) is crucial in a variety of industrial and scientific applications and necessitates a precise knowledge of the cantilever spring constant. Many methods have been devised to experimentally determine the spring constants of AFM cantilevers. The thermal fluctuation method is elegant but requires a the...

2008
Eric Finot Ali Passian Thomas Thundat

Microcantilevers were first introduced as imaging probes in Atomic Force Microscopy (AFM) due to their extremely high sensitivity in measuring surface forces. The versatility of these probes, however, allows the sensing and measurement of a host of mechanical properties of various materials. Sensor parameters such as resonance frequency, quality factor, amplitude of vibration and bending due to...

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