نتایج جستجو برای: yield estimation
تعداد نتایج: 451462 فیلتر نتایج به سال:
the measurement of wheat crop yield in large areas is time consuming and requires high expenses. one way to save time and cost, using geostatistical methods for mapping crop yield. in this research principle component analysis were used for identifying variables that have correlation with each other, and kriging and cokriging were used to map crop yield prediction. fourty six samples were used ...
In order to test remote sensing data with advanced yield formation models for accuracy and timeliness of yield estimation of corn, a project was conducted for the State Ministry for Rural Environment, Food, and Forestry of Baden-Württemberg (Germany). This project was carried out during the course of the ‘Special Yield Estimation’, a regular procedure conducted for the European Union, to more a...
crop yield estimation is one of the most important parameters for information and resources management in precision agriculture. this information is employed for optimizing the field inputs for successive cultivations. in the present study, the feasibility of sugar beet yield estimation by means of machine vision was studied. for the field experiments stripped images were taken during the growt...
to study the effects of environmental factors on milk and fat yields (240day) traits of iranian buffaloes, 22596 and 22165 records were utilized for milk and fat yield traits, respectively. uni and bivariate analysis for estimation of (co)variation components of the traits were done in five lactations. milk yield in the 1st lactation had the highest number of records (4482), collected through c...
با پیشرفت تکنولوژی و کاهش ابعاد ترانزیستور، تلرانس پارامترهای ساخت مدارات الکترونیک افزایش یافته و باعث کاهش ضریب yield می شود. در طراحی مدارات الکترونیک، طراح عموما مقادیر نامی را برای دست یابی به عملکرد مطلوب استخراج می کند، در حالی که، در عمل یک ناحیه تلرانس، به دلیل فرآیند های تصادفی حین فرآیند های ساخت، وجود دارد که بایستی در طراحی لحاظ گردد. الگوریتم های بهینه سازی طراحی تلرانس، ناحیه تلر...
This paper describes an ASIC yield model based on the CMOS bridge fault model. The model predicts defect sensitive area early in the design cycle as a function of number of gates and nets.
Crop yield estimation is an important task in apple orchard management. The current manual sampling-based yield estimation is time-consuming, labor-intensive and inaccurate. To deal with this challenge, we developed a computer vision-based system for automated, rapid and accurate yield estimation. The system uses a two-camera stereo rig for image acquisition. It works at nighttime with controll...
A novel method to improve the yield gradient estimation in parametric yield optimization is proposed. By introducing some deterministic information into the conventional Monte Carlo method and fully utilizing the samples, it is possible to obtain yield gradient estimation with significantly smaller variance. The additional computation is almost negligible. Examples are presented to indicate the...
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