X-ray powder diffraction is one of the most potential characterization tools and a nondestructive technique for characterizing both organic and inorganic crystalline materials. The method previously used for measuring phase identification, quantitative analysis and to determine structure imperfections of samples from various disciplines such as geology, polymeric, environmental, pharmaceutical,...

Essential background on the determination of absolute configuration by way of single-crystal X-ray diffraction (XRD) is presented. The use and limitations of an internal chiral reference are described. The physical model underlying the Flack parameter is explained. Absolute structure and absolute configuration are defined and their similarities and differences are highlighted. The necessary con...