نتایج جستجو برای: atomic force

تعداد نتایج: 258557  

Journal: :The journal of physical chemistry. B 2007
Michael Jaquith Erik M Muller John A Marohn

Here we introduce time-resolved electric force microscopy measurements to directly and locally probe the kinetics of charge trap formation in a polycrystalline pentacene thin-film transistor. We find that the trapping rate depends strongly on the initial concentration of free holes and that trapped charge is highly localized. The observed dependence of trapping rate on the hole chemical potenti...

Journal: :Journal of the American Chemical Society 2002
Thuc-Quyen Nguyen Mark L Bushey Louis E Brus Colin Nuckolls

This study utilizes atomic force microscopy and electrostatic force microscopy to investigate the orientation of overcrowded aromatics in films with submonolayer coverage. The results demonstrate that the side chains in the molecules can be used as a tool to control the molecular order and orientation in thin films. For molecules that do not self-associate well, the interaction with the substra...

2016
Adolf Winkler

In this article, some fundamental topics related to the initial steps of organic film growth are reviewed. General conclusions will be drawn based on experimental results obtained for the film formation of oligophenylene and pentacene molecules on gold and mica substrates. Thin films were prepared via physical vapor deposition under ultrahigh-vacuum conditions and characterized in-situ mainly b...

2016
Christopher J. MacLellan

The Additive Factors Model (AFM), a widely used model of student learning, estimates students’ prior knowledge, the difficulty of tutored skills, and the rates at which these skills are learned. In contrast to Bayesian Knowledge Tracing (BKT), another widely used model of student learning, AFM does not have parameters for the slipping rates of learned skills; i.e., it does not explicitly model ...

2006
Daisuke Yamamoto Masaaki Taniguchi Toshio Ando

Journal: :The Review of scientific instruments 2007
Ozgur Sahin

Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force wave form with the use of nonlinear dynamical response of the tapping cantilever...

2016
Shigeki Kawai Ville Haapasilta Benjamin D Lindner Kazukuni Tahara Peter Spijker Jeroen A Buitendijk Rémy Pawlak Tobias Meier Yoshito Tobe Adam S Foster Ernst Meyer

On-surface chemical reactions hold the potential for manufacturing nanoscale structures directly onto surfaces by linking carbon atoms in a single-step reaction. To fabricate more complex and functionalized structures, the control of the on-surface chemical reactions must be developed significantly. Here, we present a thermally controlled sequential three-step chemical transformation of a hydro...

2016
Marco Coïsson Gabriele Barrera Federica Celegato Alessandra Manzin Franco Vinai Paola Tiberto

Magnetic vortex chirality in patterned square dots has been investigated by means of a field-dependent magnetic force microscopy technique that allows to measure local hysteresis loops. The chirality affects the two loop branches independently, giving rise to curves that have different shapes and symmetries as a function of the details of the magnetisation reversal process in the square dot, th...

Journal: :Physical review. E 2016
Suwun Suwunnarat Huanan Li Ragnar Fleischmann Tsampikos Kottos

We demonstrate that a three-terminal harmonic symmetric chain in the presence of a Coriolis force, produced by a rotating platform that is used to place the chain, can produce thermal rectification. The direction of heat flow is reconfigurable and controlled by the angular velocity Ω of the rotating platform. A simple three-terminal triangular lattice is used to demonstrate the proposed principle.

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