نتایج جستجو برای: birefringent thin film

تعداد نتایج: 188369  

2013
Carlos M. Bledt Jeffrey E. Melzer James A. Harrington

Metal coated Hollow Glass Waveguides (HGWs) incorporating single dielectric thin films have been widely used for the low-loss transmission of infrared radiation in applications ranging from surgery to spectroscopy. While the incorporation of single dielectric film designs have traditionally been used in metal/dielectric coated HGWs, recent research has focused on the development of alternating ...

2000
T. Smy S. K. Dew

This paper deals with the determination of film, via and contact structure resistances in VLSI metalization. Simulations of the flow of electrical current through thin metal films and VLSI structures using the three dimensional microstructural thin film simulation framework 3D-Films are discussed in this paper. For each simulation, the film structures are generated by the thin film growth model...

2003
Xiaoqi Bao Yoseph Bar-Cohen Zensheu Chang

Thin-film mirrors are attractive for large apertures, lightweight optical systems and microwave antennas operating in micro-gravity environments. The surface shape of these deployable thin film structures requires control to a precision range that depends on the specific applications. For optical systems, such surfaces need to be deployed and refined in the range of sub-microns. Electroactive p...

2016
Nafarizal Nayan Huey Sia Lim Mohd Khairul Ahmad Samsul Haimi Dahlan Mohd Zainizan Sahdan Mohd Kadim Suaidi Badrul Hisham Ahmad Fauzi Mohd Johar Ghaffer Kiani

A major disadvantage of energy saving glass using tin oxide (SnO2) thin film is that SnO2 attenuates the mobile signal from passing through it. In order to improve such signal transmission, a frequency selective surface (FSS) structures are designed on SnO2 thin film. In this paper, SnO2 thin film with FSS structure was fabricated using combination of printed circuit board technology and reacti...

2013
Chung-Wei Kung Timothy Chiaan Wang Joseph E. Mondloch David Fairen-Jimenez Daniel M. Gardner Wojciech Bury Jordan Matthew Klingsporn Jonathan C. Barnes Richard Van Duyne J. Fraser Stoddart Michael R. Wasielewski Omar K. Farha Joseph T. Hupp

A uniform and crack-free metal−organic framework (MOF) thin film composed of free-standing acicular nanorods was grown on a transparent conducting glass substrate. The MOF thin film exhibits electrochromic switching between yellow and deep blue by means of a one-electron redox reaction at its pyrene-based linkers. The rigid MOF stabilizes the radical cations of the pyrene linkers at positive ap...

2017
A. A. M. Idris R. Arsat M. K. Ahmad F. Sidek

This paper reports the effect of the different deposition methods towards the ZnO nanostructure crystal quality and film thickness on the polyimide substrate. The ZnO film has been deposited by using the spray pyrolysis technique, sol-gel and RF Sputtering. Different methods give a different nanostructure of the ZnO thin film. Sol gel methods, results of nanoflowers ZnO thin film with the thick...

2013
Jae-Hwan Kim Jung-Yeol Choi Jae-Man Bae Min-Young Kim Tae-Sung Oh

A thermoelectric thin-film device consisting of n-type Bi2Te3 and p-type Sb2Te3 thin-film legs was prepared on a glass substrate by using co-evaporation and annealing process. The Seebeck coefficient and the power factor of the co-evaporated Bi2Te3 film were 130μV/K and 0.7 © 1014W/K2·m, respectively, and became substantially improved to 1160μV/K and 16 © 1014W/K2·m by annealing at 400°C for 20...

2000
HEE CHUL PAK Hee Chul Pak

Models for distributed capacitance in a thin lm are derived in the form of a system of local RC diiusion equations coupled by a global elliptic equation. Such models contain the local geometry of the distributed capacitance on which charge is stored and the exchange of current ux on its interface with the medium. Certain singular limits are characterized, and the resulting degenerate initial-bo...

2007
X. Feng Y. Huang A. J. Rosakis

Current methodologies used for the inference of thin film stress through system curvature measurements are strictly restricted to stress and curvature states which are assumed to remain uniform over the entire film/substrate system. Recently Huang, Rosakis, and coworkers [Acta Mech. Sinica, 21, pp. 362–370 (2005); J. Mech. Phys. Solids, 53, 2483– 2500 (2005); Thin Solid Films, 515, pp. 2220–222...

2008
R. Brogle

CP398, Advanced Accelerator Concepts, edited by S. Chattopadhyay, J. McCullough, and E Dahl AIP Press, New York © 1997 747 Downloaded 18 Aug 2009 to 128.97.92.208. Redistribution subject to AIP license or copyright; see http://proceedings.aip.org/proceedings/cpcr.jsp

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