نتایج جستجو برای: inspection error
تعداد نتایج: 283689 فیلتر نتایج به سال:
In this paper, the authors rectified ZY-3 satellite data with a total of 5 commonly used topographic correction models, and investigate its impact on the regression fitting estimation of shrub forest leaf biomass in the study area. Through visual inspection, statistical analysis and correlation analysis to evaluate every result of the correction models, and the result shows that Minnaert +SCS m...
Discharge patterns produced by fibres from normal and impaired auditory nerves in response to speech and other complex sounds can be discriminated subjectively through visual inspection. Similarly, responses from auditory nerves where speech is presented at diminishing sound levels progressively deteriorate from those at normal listening levels. This paper presents a Neurogram Similarity Index ...
We propose and analyze a family of information processing systems, where a finite set of experts or servers are employed to extract information about a stream of incoming jobs. Each job is associated with a hidden label drawn from some prior distribution. An inspection by an expert produces a noisy outcome that depends both on the job’s hidden label and the type of the expert, and occupies the ...
Infrared thermography has proved to be an adequate technique for building inspection, as it can be used to determine energy efficiency through the measurement of heat losses, air leaks and infiltrations, and also to detect humidity areas. These parameters have great influence in energy consumption of buildings and in their users' well-being, which is demonstrated by the appearance of regulation...
CCC-r control chart is a monitoring technique for high yield processes. It is based on the analysis of the number of inspected items until observing a specific number of defective items. One of the assumptions in implementing CCC-r chart that has a significant effect on the design of the control chart is that the inspection is perfect. However, in reality, due to the multiple reasons, the...
Karen M. Kapheim,*† Hailin Pan,* Cai Li, Steven L. Salzberg, Daniela Puiu, Tanja Magoc, Hugh M. Robertson, Matthew E. Hudson, Aarti Venkat, Brielle J. Fischman, Alvaro Hernandez, Mark Yandell, Daniel Ence, Carson Holt, George D. Yocum, William P. Kemp, Jordi Bosch, Robert M. Waterhouse, Evgeny M. Zdobnov, Eckart Stolle, F. Bernhard Kraus, Sophie Helbing, Robin F. A. Moritz, Karl M. Glastad, Bre...
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