نتایج جستجو برای: large scale integration

تعداد نتایج: 1584820  

2013
Se-Hyun Yang Michael Powell Babak Falsafi Kaushik Roy T. N. Vijaykumar

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Journal: :IEEE Design & Test of Computers 2003
Soha Hassoun Yong-Bin Kim Fabrizio Lombardi

Journal: :Inf. Process. Lett. 1991
Roberto Tamassia Ioannis G. Tollis Jeffrey Scott Vitter

We study planar orthogonal drawings of graphs and provide lower bounds on the number of bends along the edges. We exhibit graphs on n vertices that require (n) bends in any layout, and show that there exist optimal drawings that require (n) bends and have all of them on a single edge of length (n 2). This work nds applications in VLSI layout, aesthetic graph drawing, and communication by light ...

1999
Maolin Tang Kamran Eshraghian Hon Nin Cheung

| Constrained Via Minimization is the problem of reassigning wire segments of a VLSI routing so that the number of vias is minimized. In this paper, a new approach is proposed for twolayer VLSI routing. This approach is able to handle any types of routing, and allows arbitrary number of wire segments split at a via candidate.

1989
Claudia Romanova Ulrich Wagner

Journal: :IEEE Trans. on CAD of Integrated Circuits and Systems 1992
Kuochen Wang Sy-Yen Kuo

In this paper, we present an integrated computeraided design environment, the VAR (VHDL-based Array Reconfiguration) system, for the tasks of design, reconfiguration, simulation, and evaluation in an architecture modeled by VHDL. An easily diagnosable and reconfigurable two-dimensional defect-tolerant PE-switch lattice array is used as an example to illustrate the methodology of VAR. VAR allows...

1997
M. Bacis Giacomo Buonanno Fabrizio Ferrandi Franco Fummi Luca Gerli Donatella Sciuto

The test problem increasingly affects system design process, related costs and time to market. Requirements from VLSI/WSI manufacturers are for fast and reliable testability tools, with the possibility of their introduction in early phases of design. This paper presents a global toolset architecture for testability analysis and test pattern generation. Three abstraction levels are considered in...

1999
Elise de Doncker Ajay Gupta Rodger R. Zanny

We present and analyze strategies which can be used for the parallel computation of large numbers of integrals which may be of diierent levels of diiculty. Paralleliza-tion on the integral level, which is generally used for large numbers of integrals, is combined with parallelization on the subregion level, which enables handling local integration diiculties within individual problems. This res...

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