نتایج جستجو برای: magnetic force microscope

تعداد نتایج: 557449  

1995
David R. Baselt Gil U Lee Richard J. Colton

We are developing a sensor capable of detecting biological species such as cells, proteins, toxins, and DNA at concentrations as low as 10-18 M. The force amplified biological sensor will take advantage of the high sensitivity of force microscope cantilevers to detect the presence of as little as one superparamagnetic particle bound to a cantilever by a sandwich immunoassay technique. The devic...

2012
M. Trassinelli E. Lacaze E. Lamour X. Luo S. Hidki M. Marangolo J. Mérot C. Prigent R. Reuschl J.-P. Rozet S. Steydli D. Vernhet

We present the first investigation on the effect of highly charged ion bombardment on a manganese arsenide thin film. The MnAs films, 150 nm thick, are irradiated with 90 keV Ne ions with a dose varying from 1.6× 10 to 1.6×10 ions/cm. The structural and magnetic properties of the film after irradiation are investigated using different techniques, namely, X-ray diffraction, magneto-optic Kerr ef...

Journal: :نشریه دانشکده فنی 0
پیروز پیروز

it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...

1998
B. J. Suh P. C. Hammel Z. Zhang M. L. Roukes J. R. Childress

Lateral one-dimensional imaging of cobalt ~Co! films by means of microscopic ferromagnetic resonance ~FMR! detected using the magnetic resonance force microscope ~MRFM! is demonstrated. A novel approach involving scanning a localized magnetic probe is shown to enable FMR imaging in spite of the broad resonance linewidth. We introduce a spatially selective local field by means of a small, magnet...

Journal: :Physical review letters 2014
A Hamadeh O d'Allivy Kelly C Hahn H Meley R Bernard A H Molpeceres V V Naletov M Viret A Anane V Cros S O Demokritov J L Prieto M Muñoz G de Loubens O Klein

It is demonstrated that the threshold current for damping compensation can be reached in a 5  μm diameter YIG(20  nm)|Pt(7  nm) disk. The demonstration rests upon the measurement of the ferromagnetic resonance linewidth as a function of I(dc) using a magnetic resonance force microscope (MRFM). It is shown that the magnetic losses of spin-wave modes existing in the magnetic insulator can be redu...

1999
Jeffrey L. Hutter John Bechhoefer

Images and force measurements taken by an atomic-force microscope ( AFM) depend greatly on the properties of the spring and tip used to probe the sample’s surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of curvature of an AFM tip. Our procedure u...

2008
Ming Liu David Chelidze

6 Local flow variation (LFV) method of nonlinear time series analysis is applied to 7 develop a chaotic motion based atomic force microscope (AFM). The method is 8 validated by analyzing time series from a simple numerical model of a tapping mode 9 AFM. For both calibration and measurement procedures the simulated motions of 10 the AFM are nominally chaotic. However, the distance between a tip ...

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