Various measures of security of stream ciphers have been studied that are based on the problem of finding a minimum size generator for the keystream in some special class of generators. These include linear and p-adic spans, as well as π-adic span, which is based on a choice of an element π in a finite extension of the integers. The corresponding sequence generators are known as linear feedback...

Realizing a sequential machine with shift registers is an attractive approach to the design for testability. It requires little extra circuit for scan and since feed-backs are always to the rst ip-op of a shift register test generation is expected to be easier than that for circuits with unstructured feedbacks. Though the shift register realization of sequential machines was studied by several ...

Test Pattern Generators (TPG) are very important logic part of the Circuits that have self-test features. Nowadays, the self-test feature is an in-built part of the modern application hardware designs. This feature enables the user to test and verify the specific hardware failure with the help of the hardware itself. To enable self-test an extra operational and control circuit is required by th...

the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. Abstract In this paper, we design a self-shrinking scheme which combines a feedback with carry shift register and the self-shrinking generator, based on A. Kanso PhD study. We calculated the period of the designed algorithm. The ke...

In recent years, with fast growth of mobile communication and portable computing systems, design for low power has become the challenge in the field of Digital VLSI design. The main focus of the paper is to make a comparative study of low power Linear Feedback Shift Register (LFSR) architecture such as Built In Self Test (BIST), it has been often seen that during test mode process the power con...

The main goal of genetic programming is to get best pattern in terms of randomness. There are various methods for random pattern generation. The patterns generated in this paper are pseudo-random in nature. Different types of linear feedback shift register (LFSR) are used to generate pseudo-random patterns and test their randomness by various testing algorithms. Random patterns are compared acc...