The occurrence of radiation-induced soft errors in electronic computing systems can either affect non-essential system functionalities or violate safety–critical conditions, which might incur life-threatening situations. To reach high safety standard levels, reliability engineers must be able to explore and identify efficient mitigation solutions reduce the at initial design cycle. This paper p...

The exponential dependence of the soft-error rate (SER) with critical charge in CMOS circuits, empirically proposed by Hazucha and Svensson, is derived framework diffusion-collection approach. A full analytical formulation established, linking SER physical technological parameters, notably circuit supply voltage, carrier diffusion coefficient ion characteristics.

In this paper, a Soft Error Hardened D-latch with improved performance is proposed, also featuring Single Event Upset (SEU) and Transient (SET) immunity. This novel can tolerate particles as charge injection in different internal nodes, well the input output nodes. The of new circuit has been assessed through key parameters, such power consumption, delay, Power-Delay Product (PDP) at various fr...

In the atmosphere, it is generally understood that neutrons are main contributor to soft error rate (SER) in electronic devices. These particles indeed able trigger nuclear reactions sensitive regions of devices, leading secondary ions may ionize matter sufficiently upset a memory cell or induce transient signal, known as errors. For reliability purposes, crucial be estimate SER associated with...

Deep sub-micron memory devices play a crucial role in space electronic applications due to their susceptibility single-event upset and double-node types of soft errors. When charged particle from hit scaled circuit, the critical charge sensitive storage nodes drops, node happens across nodes. This paper describes error immune RHBD-14T SRAM cell (SEI-14T) for satellite applications. The SEI-14T ...

This correspondence presents an optimal soft-in soft-out (SISO) decoding algorithm for the binary image of Reed–Solomon (RS) codes that is based on Vardy and Be’ery’s optimal soft-in hard-out algorithm. A novel suboptimal list-based SISO decoder that exploits Vardy and Be’ery’s decomposition is also presented. For those codes with very high rate, which allows practical decoding with the propose...