نتایج جستجو برای: surface mean root square roughness σrms

تعداد نتایج: 1384694  

Journal: :Wood Material Science and Engineering 2023

The objective of this work was to evaluate the effect impregnation process pine wood (Pinus sylvestris L.) on roughness parameters surface processed a frame sawing. samples were dried and impregnated using commercial procedure by local company. touch method with use measuring stylus (pin) employed determine considering parameters, namely, arithmetical mean value (Ra), total height profile (Rt),...

2016
Hangyu Liu Sean Reilly Johannes Herrnsdorf Enyuan Xie Vasili G. Savitski Alan J. Kemp Erdan Gu Martin D. Dawson

Article history: Received 1 December 2015 Received in revised form 19 January 2016 Accepted 20 January 2016 Available online 22 January 2016 The design and fabrication of large radii of curvature micro-lenses in single crystal chemical vapour deposition diamond is described. An optimised photoresist reflow process and low selectivity inductively coupled plasma etching are used to actualize a un...

2008
Zhiwen Zhou Cheng Li Hongkai Lai Songyan Chen Jinzhong Yu

High-quality Ge epilayer on Si(1 0 0) substrate with an inserted low-temperature Ge seed layer and a thin Si0.77Ge0.23 layer was grown by ultrahigh vacuum chemical vapor deposition. The epitaxial Ge layer with surface root-mean-square roughness of 0.7 nm and threading dislocation density of 5 10 cm 2 was obtained. The influence of low temperature Ge seed layer on the quality of Ge epilayer was ...

2014
K. IBRAHIM M. H. EISA M. A. ALRAJHI

This paper studies the properties of thermally evaporated 1 μm of aluminium (Al) thin films on polyimide (PI) and polyethylene terephthalate (PET) substrates at room temperature with thermal evaporation in a vacuum of about 3 x 10 -5 Torr for use as window materials for solar cells. Effects of substrate types on the structural and electrical characteristics of the films were studied. Sets of ex...

Journal: :Optics express 2017
Siming Chen Mengya Liao Mingchu Tang Jiang Wu Mickael Martin Thierry Baron Alwyn Seeds Huiyun Liu

We report on the first electrically pumped continuous-wave (cw) InAs/GaAs quantum dot (QD) lasers monolithically grown on on-axis Si (001) substrates without any intermediate buffer layers. A 400 nm antiphase boundary (APB) free epitaxial GaAs film with a small root-mean-square (RMS) surface roughness of 0.86 nm was first deposited on a 300 mm standard industry-compatible on-axis Si (001) subst...

2018
Roland W L van Vliembergen Leo J van IJzendoorn Menno W J Prins

We demonstrate a novel approach to quantify the interparticle distance in colloidal dimers using Mie scattering. The interparticle distance is varied in a controlled way by changing the ionic strength of the solution and the magnetic attraction between the particles. The measured scaling behavior is interpreted using an energy-distance model that includes the repulsive electrostatic and attract...

2008

We report the fabrication process, material and electrical characterizations of ultra thin body (UTB) thin film transistors (TFTs) by using in situ doped polysilicon followed by the chemical mechanical polishing (CMP) process. The resulting polysilicon film is about 13 nm thick with approximately 1019 cm-3 body doping. Root mean square (RMS) surface roughness below 1 nm is achieved over 25 μm2 ...

Journal: :E3S web of conferences 2023

This study used atomic force microscopy (AFM) to examine the microstructure properties of a composite biofilm made hydroxypropylcellulose (HPC) and cinnamaldehyde (CDH). The zeta potential HPC-based solution was found decrease from -1.31 - 3.24 (mV) with addition CDH-emulsified CDH, according Zetasizer analysis. Additionally, roughness surface showed an increasing trend. AFM analysis indicated ...

Journal: :Journal of the Japan society of photogrammetry and remote sensing 1994

Journal: :علوم کاربردی و محاسباتی در مکانیک 0
محرم حبیب نژاد کورایم هدیه بادکوبه هزاوه معین طاهری

in this paper, surface roughness of ht29 cancerous is determined using topography images obtained by atimic force microscopy (afm). the mean radiuses of cell and substrate surface asperities are determined, based on results of conducted roughness analysis and rabinovich roughness theory. these values have been applied in the equations of rough particle nanomanipulation dynamic model and the amo...

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