نتایج جستجو برای: a greater than 1 ler obtained
تعداد نتایج: 14196102 فیلتر نتایج به سال:
Leaf elongation rate (LER) in grasses is dependent on epidermal cell supply (number) and on rate and duration of epidermal cell elongation. Nitrogen (N) fertilization increases LER. Longitudinal sections from two genotypes of tall fescue (Festuca arundinacea Schreb.), which differ by 50% in LER, were used to quantify the effects of N on the components of epidermal cell elongation and on mesophy...
in this thesis a calibration transfer method is used to achieve bilinearity for augmented first order kinetic data. first, the proposed method is investigated using simulated data and next the concept is applied to experimental data. the experimental data consists of spectroscopic monitoring of the first order degradation reaction of carbaryl. this component is used for control of pests in frui...
BACKGROUND AND AIMS Growth of grass species in temperate-humid regions is restricted by low temperatures. This study analyses the origin (intrinsic or size-mediated) and mechanisms (activity of individual meristems vs. number of active meristems) of differences between Bromus stamineus and Lolium perenne in the response of leaf elongation to moderately low temperatures. METHODS Field experime...
In order to evaluate the benefits of maize, pinto bean and naked pumpkin triple cropping, an experiment was carried out as a randomized complete block design with three replications at Faculty of Agricultural Science, University of Guilan, Rasht, Iran in 2012. The treatments consisted of maize, pinto bean and naked pumpkin sole cropping (100, 75 and 50% of conventional densities), maize – pinto...
biological fertilizers can be suitable alternative to chemical fertilizers to increase soil fertility and crop production in sustainable agriculture. in order to evaluation of integrated application of bio-fertilizers and chemical fertilizers on on quantitative and qualitative yield of ajowan in strip intercropping, a field experiment was conducted in a factorial design based on randomized comp...
Line Edge Roughness (LER), caused by tolerances inherent to materials and tools used in lithography processes, is not a new phenomenon. Yet, the imperfections caused by LER have caused little worry over the years since the critical dimensions of MOSFETs were almost two orders of magnitude larger than the roughness. However, as the aggressive scaling of Si-MOSFETs continues to the sub-100 nm reg...
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