نتایج جستجو برای: afm analysis
تعداد نتایج: 2833224 فیلتر نتایج به سال:
nanoscale science and technology has today mainly focused on the fabrication of nano devices. in this paper, we study the use of lithography process to build the desired nanostructures directly. nanolithography on polymethylmethacrylate (pmma) surface is carried out by using atomic force microscope (afm) equipped with silicon tip, in contact mode. the analysis of the results shows that the dept...
An experiment to study the effect of inter and intra row spacing on the yielding performance of periwinkle species was conducted at Nagarjun Medicinal and Aromatic Plants Research Scheme, P. K. V., Akola (M. S.) during 1980 - 81 to 82 - 83. Three species viz., Catharanthus roseus, Catharanthus alba and Catharanthus oscillatus did not differ significantly in respect of dried foliage and root yie...
The atomic force microscope (AFM) has found wide applicability as a nanoindentation tool to measure local elastic properties of soft materials. An automated approach to the processing of AFM indentation data, namely, the extraction of Young's modulus, is essential to realizing the high-throughput potential of the instrument as an elasticity probe for typical soft materials that exhibit inhomoge...
Atomic force microscopy (AFM) is a useful tool for probing pressure sensitive surfaces (PSA) at the micron and sub-micron level. Investigators hope that the spatial resolution of microstructure will provide clues to function. Nevertheless, AFM cannot distinguish functional group chemistry associated with topology. In contrast, FT-IR imaging microscopy is an emerging technology that has the powe...
Atomic force microscope (AFM) tip-based nanomachining is currently the object of intense research investigations. Values of the load applied to the tip at the free end of the AFM cantilever probe used for nanomachining are always large enough to induce plastic deformation on the specimen surface contrary to the small load values used for the conventional contact mode AFM imaging. This study des...
The distribution of edge and basal surface areas of phyllosilicate particles is an essential parameter for understanding the interaction mechanisms at solid/gas or solid/liquid interfaces. Among the techniques proposed to determine the geometrical heterogeneities of flat solids, low-pressure argon adsorption and AFM analysis are the most promising to derive the weight-averaged values of specifi...
Vibration is a key factor to be considered when designing the mechanical components of a high precision and high speed atomic force microscope (AFM). It is required to design the mechanical components so that they have resonant frequencies higher than the external and internal vibration frequencies. In this work, the mechanical vibration in a conventional AFM system is analyzed by considering i...
Atomic Force Microscopy (AFM) can be used to obtain high-resolution topographical images of bacteria revealing surface details and cell integrity. During scanning however, the interactions between the AFM probe and the membrane results in distortion of the images. Such distortions or artifacts are the result of geometrical effects related to bacterial cell height, specimen curvature and the AFM...
A method for detection and identification of core antigen of hepatitis C virus (HCVcoreAg)-containing particles in the serum was proposed, with due account taken of the interactions of proteotypic peptides with Na(+), K(+), and Cl(-) ions. The method is based on a combination of reversible biospecific atomic force microscopy (AFM)-fishing and mass spectrometry (MS). AFM-fishing enables concentr...
Scanning Probe Microscopy has been routinely employed as a surface characterization technique for nearly 20 years. Atomic Force Microscopy is the most widely used subset of SPM, which can be used in ambient conditions with minimum sample preparation. AFM is able to measure three-dimensional topography information from the angstrom level to the micron scale with unprecedented resolution. This pa...
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