This paper presents a system named ADC TEST that estimates the static and dynamic parameters of an analog-to-digital converter according to the definitions given in IEEE Standard 1241. One shows the available output graphical pages with theirs information and facilities in a practical testing application.

Traditionally, work on analog testing has focused on diagnosing faults in board designs. Recently, with increasing levels of integration, not just diagnosing faults, but distinguishing between faulty and good circuits has become a problem. Analog blocks embedded in digital systems may not easily be separately testable. Consequently, many papers have been recently written proposing techniques to...

Abstract Analog ICs in general have many performance metrics that depends on multitude of device parameters. Parametric yield loss is often a problem in analog IC designs, where a significant portion of ICs manufactured fail specification test due to variation in process parameters. Parametric faults are mainly caused by statistical fluctuations in the manufacturing process. It causes the analo...

Histogram Analog Built-In Self Test (or HABISTTM) is an efficient technique to compare analog signals against expected waveforms. Java-based software allows designing and implementing tests which can be used in the testing environment.

– Core-based testing, which is described by the proposed IEEE standard P1500, is an effective test method for Systems-on-Chip (SOC) containing embedded cores. This test method is usable for all classes of digital cores and provides solutions that allow automatic identification and configuration of testability features in SOC containing embedded cores. In this moment, IEEE P1500 is restricted to...

In recent years, Defect Oriented Testing (DOT) has been investigated as an alternative testing method for analog circuits. In this paper, we propose a wavelet transform based dynamic supply current (IDD) analysis technique for detecting catastrophic and parametric faults in analog circuits. Wavelet transform has the property of resolving events in both time and frequency domain simultaneously u...

Compaction testing methods allow at-speed detecting of errors while possessing low cost of implementation. Owing to this distinctive feature, compaction methods have been widely used for built-in testing, as well as external testing. In the latter case, the bandwidth requirements to the automated test equipment employed are relaxed which reduces the overall cost of testing. Concurrent compactio...

---------------------------------------------------------------------***--------------------------------------------------------------------Abstract A method to select diagnosis variables or test variables for analog circuit testing and to diagnose multiple soft faults in non linear analog circuits using multiple frequency measurements is proposed in this paper. Circuit parameters or the test v...