the resonant frequency and sensitivity of an atomic force microscope (afm) cantilever with assembled cantilever probe (acp) have been analyzed and a closed-form expression for the sensitivity of vibration modes has been obtained. the proposed acp comprises an inclined cantilever and extension, and a tip located at the free end of the extension, which makes the afm capable of topography at sidew...

Nowadays, atomic-force microscopy plays a significant role in nanoscience and nanotechnology, and is widely used for direct measurement at atomic scale and scanning the sample surfaces. In tapping mode, the microcantilever of atomic-force microscope is excited at resonance frequency. Therefore, it is important to study its resonance. Moreover, atomic-force microscopes can be operated in fluid e...

a relationship based on the modified couple stress theory is developed to investigate the flexural sensitivity of an atomic force microscope (afm) with assembled cantilever probe (acp). this acp comprises a horizontal cantilever, two vertical extensions and two tips located at the free ends of the extensions which form a caliper. an approximate solution to the flexural vibration problem is obta...