نتایج جستجو برای: automatic test pattern generation
تعداد نتایج: 1564107 فیلتر نتایج به سال:
most contemporary clinical reasoning tests typically assess non-automatic thinking. therefore, a test is needed to measure automatic reasoning or pattern recognition, which has been largely neglected in clinical reasoning tests. the puzzle test (pt) is dedicated to assess automatic clinical reasoning in routine situations. this test has been introduced first in 2009 by monajemi et al in the oly...
Current VLSI manufacturing processes suffer from larger defective parts ratio, partly due to numerous emerging defect types. While traditional fault models, such as the stuck at and transition delay fault models are still widely used, they have been shown to be inadequate to handle these new defects. The main aim is to develop a complete behavioral fault simulation and automatic test pattern ge...
In current design practice synthesis tools play a key role, letting designers to concentrate on the specification of the system being designed by carrying out repetitive tasks such as architecture synthesis and technology mapping. However, in the new design flow, validation still remains a challenge: while new technologies based on formal verification are only marginally accepted for large desi...
Most contemporary clinical reasoning tests typically assess non-automatic thinking. Therefore, a test is needed to measure automatic reasoning or pattern recognition, which has been largely neglected in clinical reasoning tests. The Puzzle Test (PT) is dedicated to assess automatic clinical reasoning in routine situations. This test has been introduced first in 2009 by Monajemi et al in the Oly...
Embedded cores are now commonplace in large system-on-chip designs. However, since embedded cores are not directly accessible via chip inputs and outputs, special access mechanisms are required to test them at the system level. Testaccess architecture, also referred to as a test-access mechanism (TAM), provides on-chip test data transport. Now days, multi core processor consists of more number ...
Hierarchical Test Pattern Generation Using a Genetic Algorithm with a Dynamic Global Reference Table
In this paper the authors present a hierarchical Automatic Test Pattern Generation (ATPG) system, which searches for a compact set of test patterns, in an otherwise large search-space. A Genetic Algorithm (GA) is employed by the system, and the search for test patterns is guided by dynamically evolving a global record table (GRT), which is the prime component for directing the search towards an...
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