نتایج جستجو برای: dielectric film

تعداد نتایج: 127390  

2005
H. KOGELNIK

Dielectric waveguides are the structures that are used to confine and guide the light in the guided-wave devices and circuits of integrated optics. This chapter is devoted to the theory of these waveguides. Other chapters of this book discuss their fabrication by such techniques as sputtering, diffusion, ion implantation or epitaxial growth. A wellknown dielectric waveguide is, of course, the o...

2007
Pierre Hillion

We analyse the reflection of a TM electromagnetic field first on a flat dielectric film and second on a Veselago film with negative refractive index, both films being deposited on a metallic substrat acting as a mirror. An incident harmonic plane wave generates inside a conventional dielectric film a refracted propagating wave and an evanescent wave that does not contribute to reflection on the...

A. Bahari, M. Derahkshi M. Jamali M. Roodbari Shahmiri

Polyvinylpyrrolidone  /  Nickel  oxide  (PVP/NiO)  dielectrics  were fabricated  with  sol-gel  method  using  0.2  g  of  PVP  at  different working  temperatures  of  80,  150  and  200  ºC.  Structural  properties and surface morphology of the hybrid films were investigated by X- Ray  diffraction  (XRD)  and  Scanning  Electron Microscope  (SEM) respectively. Energy dispersive X-ray spec...

2012
A. Srivastava

Studies of Metal–insulator–metal (MIM) capacitors having high-κ La2O3\HfO2 dielectric stacks are fabricated using Pulse Laser Deposition (PLD) is carried out. Nano-sized La2O3\HfO2 dielectric stacks are deposited using PLD system under optimized pressure, substrate temperature and numbers of shots inside argon ambient chamber. The morphology of dielectric stacks is examined using AFM and the th...

Journal: :Optics express 2010
M Guillaumée A Yu Nikitin M J K Klein L A Dunbar V Spassov R Eckert L Martín-Moreno F J García-Vidal R P Stanley

Enhanced optical transmission (EOT) through a single aperture is usually achieved by exciting surface plasmon polaritons with periodic grooves. Surface plasmon polaritons are only excited by p-polarized incident light, i.e. with the electric field perpendicular to the direction of the grooves. The present study experimentally investigates EOT for s-polarized light. A subwavelength slit surround...

2003
T. R. Taylor P. J. Hansen J. S. Speck

The dielectric permittivity, dielectric quality factor ~inverse dielectric loss!, and lattice parameter of 140 nm sputtered SrTiO3 films were dependent on the oxygen partial pressure and total chamber pressure (O21Ar) during film growth. Films were grown at 25 and 75 mTorr ~mT! in an oxygen rich and oxygen deficient sputtering gas environment concurrently on ~100! SrTiO3 and ~111! Pt/~0001! Al2...

2011
Hussain A. Badran

Problem statement: The some optical constants polymer thin film with red dye 3-amino-7dimethylamino-2-methyl phenazine (NR) as the guest material and Polyvinylpyrrolidone (PVP) as the host material were prepared by adulteration and spin-coating methods. Approach: The values of some important parameters (refractive index n, extinction coefficient K and dielectric constant ε∞) of polymer thin fil...

2016
K. C. Chan

This paper reports the characterization of a photosensitive benzocyclobutene (BCB), a low dielectric constant spin-on polymer for use as interlayer dielectric in the microelectronics industry. Research work is divided into three main sections. First, BCB thin film characterization was done to investigate the effects of curing conditions on BCB film thickness, dielectric properties, optical prop...

2004
J. S. Vasconcelos J. A. Varela E. Longo

Ferroelectric SrBi2Nb2O9 (SBN) thin films were prepared by the polymeric precursors method and deposited by spin coating onto Pt/Ti/SiO2/Si substrate and crystallized using a domestic microwave oven. It was studied the influence of the heat flux direction and the duration of the thermal treatment on the films crystallization. An element with high dielectric loss, a SiC susceptor, was used to ab...

2012
Elena Castellano-Hernández Francisco B Rodríguez Eduardo Serrano Pablo Varona Gomez Monivas Sacha

The use of electrostatic force microscopy (EFM) to characterize and manipulate surfaces at the nanoscale usually faces the problem of dealing with systems where several parameters are not known. Artificial neural networks (ANNs) have demonstrated to be a very useful tool to tackle this type of problems. Here, we show that the use of ANNs allows us to quantitatively estimate magnitudes such as t...

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