Contact and non-contact based atomic force microscopy (AFM) approaches have been extensively utilized to explore various nanoscale surface properties. In most AFM-based measurements, a concurrent electrostatic effect between the AFM tip/cantilever and sample surface can occur. This electrostatic effect often hinders accurate measurements. Thus, it is very important to quantify as well as remove...

Kelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force. The spatial resolution of KPFM is intrinsically limited by the long range of the electrostatic interaction, which includes contributions from the macroscopic cantilever and the conical tip. Here, we prese...

We present an electrostatic tactile display for stimulus localization. The 240-Hz electrostatic force was generated by the beat phenomenon in a region where excited X electrodes cross excited Y electrodes, which presents localized tactile sensation out of the entire surface. A 10.4in. visual-tactile integrated display was successfully demonstrated. key words: tactile display, electrostatic forc...