Limited energy consumption in multimedia requires very low power circuits. In this paper we focused on leakage current minimization in single static random access memory (SRAM) cell in 90nm complementary metal oxide semiconductor (CMOS) technology. The leakage current mainly consists of sub threshold leakage current and gate leakage current in 90nm CMOS technology. So minimizing the sub thresho...

Garg, Jain, and Sahai first consider zero knowledge proofs in the presence of leakage on the local state of the prover, and present a leakageresilient-zero-knowledge proof system for HC (Hamiltonian Cycle) problem. Their construction is called (1 + ε)-leakage-resilient zero-knowledge, for any constant ε > 0, because the total length of the leakage the simulator needs is (1 + ε) times as large a...

This paper shows leakage as a limit to the effectiveness of voltage scaling as a means of reducing the energy per operation in a digital circuit. Methods of decreasing operational or dynamic leakage are then discussed. The design and simulation results of a sense amplifier-based pass transistor logic (SAPTL) circuit topology as a low leakage and low energy alternative is presented and then comp...

The effects of building leakage on heat and mass transfer in buildings are difficult to model due to the difficulty in knowing crack size, shape, position, and number. Nevertheless, interest remains high in the estimation of crack areas in buildings because of the important effects cracks have on infiltration, indoor air quality, building energy performance, and because of interest in exploring...

In this paper we develop a fast approach to analyze the total leakage power of a large circuit block, considering both gate leakage, Igate, and subthreshold leakage, Isub. The interaction between Isub and Igate complicates analysis in arbitrary CMOS topologies. We propose simple and accurate heuristics to quickly estimate the statedependent total leakage current considering the interaction betw...

In the measurement of mutual capacitance between electrodes both the coupling and the leakage effect contribute to the measurement result whereas the leakage mode is dominant in the selfcapacitance mode. While the coupling effect is mainly defined by the geometry and material distribution close to the electrodes, the root cause or modulation of the leakage effect may be far away from the electr...

Increasing leakage energy consumption is an important problem for SOC-based platforms as such platforms rely on large on-chip SRAMs. While most of the previous techniques focus on hardware based leakage optimization, in this paper, we present an application access pattern oriented strategy for reducing instruction cache leakage energy. This strategy keeps track of the dynamic transitions betwee...