نتایج جستجو برای: memory test algorithm
تعداد نتایج: 1708805 فیلتر نتایج به سال:
Systems-on-Chip(SoC)s are now moving from logic dominant to memory dominant chips in order to satisfy high functionality and short development cycle. This means that the yield of memory part is the most important factor for the entire chip yield. In this paper, two word-oriented memory test algorithms are proposed newly. The one is an efficient writing NPSF test algorithm and the other is an ef...
We present a new pseudorandom testing algorithm f o r the Built-In Self-Test (BIST) of DRAM. In this algorithm, test patterns are complemented to generate state-transitions that are needed f o r the detection of coulping faults. A s a result, the number of test patterns required is less than half of the traditional method, while the extra hardware is negligible.
background: multiple sclerosis (ms) is a chronic demyelinating disease that can affect cognitive function. the purpose of this study was to assess the efficacy of ginkgo biloba (gb) on improvement of memory impairment and quality of life in patients with ms. methods: this study was an 8-week, open study of patients with ms. thirty patients was recruited from a variety of outpatient settings. al...
The design and architecture of a reconngurable memory BIST unit is presented. The proposed memory BIST unit could accommodate changes in the test algorithm with no impact to the hardware. Diierent types of march test algorithms could be realized using the proposed memory BIST unit and the proposed architecture allows addition and elimination of the memory BIST components. Therefore memories wit...
The phase transformation phenomenon due to the crystallographic change of shape memory alloys subjected to mechanical or thermal loading is very complicated. Regarding the thermo-mechanical coupling effects in shape memory alloys, in case of high loading rates, heat generation/absorption during the forward/reverse transformation, will lead in temperature-dependent variation and consequent...
FinFET memory is widely used in various semiconductor products due to its good read/write margin, lower power consumption, and faster driving speed. However, the forked 3D physical structure increased density of storage are very susceptible manufacturing defects, which may cause functional logic faults that different from traditional planar CMOS memories. Therefore, it critical explore an effec...
a b s t r a c t introduction: diabetes mellitus is accompanied with disturbances in learning, memory, and cognitive skills in the human society and experimental animals. due to anti-diabetic and antioxidant activity of rumex patientia (rp), this research study was conducted to evaluate the efficacy of chronic rumex patientia feeding on alleviation of learning and memory disturbance in streptozo...
This paper describes a non-linear great deluge hyper-heuristic incorporating a reinforcement learning mechanism for the selection of low-level heuristics and a non-linear great deluge acceptance criterion. The proposed hyper-heuristic deals with complete solutions, i.e. it is a solution improvement approach not a constructive one. Two types of reinforcement learning are investigated: learning w...
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