نتایج جستجو برای: ray diffraction xrd

تعداد نتایج: 341829  

2006
Ge “Joseph” Liu Bernd Fruhberger Ivan K. Schuller Heather J. Haugan Gail J. Brown

Molecular beam epitaxy grown InAs/GaSb superlattices, containing InSb-like interfacial layers, were analyzed by a combination of x-ray diffraction XRD and structural refinement. The superlattice refinement from x rays SUPREX method determines with high accuracy the average thicknesses and d spacings of the individual InAs and GaSb layers in addition to standard structural parameters usually obt...

Journal: :international journal of nano dimension 0
n. parsafar research institute of applied sciences, academic center of education, culture and research (acecr), shahid beheshti university, tehran, iran. a. ebrahimzad research institute of applied sciences, academic center of education, culture and research (acecr), shahid beheshti university, tehran, iran.

tellurium nanostructures have been prepared by physical vapor deposition method in a tube furnace. the experiments were carried out under argon gas flow at a pressure of 1 mbar. tellurium powder was evaporated by heating at 350°c and 430°c and was condensed on substrates at 110–250°c, in the downstream of argon gas flow. the products were characterized by field emission scanning electron micros...

Journal: :Inorganic chemistry 2006
Rajendra Shakya Paul H Keyes Mary Jane Heeg Azzam Moussawel Paul A Heiney Claudio N Verani

A new ligand containing long alkyl (octadecyl) chains was used to obtain the mesogenic complex [L2Cu4(mu4-O)(OAc)4].EtOH (1). This complex was thoroughly characterized and had its molecular structure solved by X-ray diffraction (XRD). Mesomorphic properties were demonstrated by means of polarized microscopy, differential scanning calorimetry, and XRD.

Journal: :EURASIP J. Adv. Sig. Proc. 2007
M. Ladisa Antonio Lamura Teresa Laudadio Giovanni Nico

A filter based on the Hankel Lanczos Singular Value Decomposition (HLSVD) technique is presented and applied for the first time to X-ray diffraction (XRD) data. Synthetic and real powder XRD intensity profiles of nanocrystals are used to study the filter performances with different noise levels. Results show the robustness of the HLSVD filter and its capability to extract easily and efficiently...

2001
H. Takagi K. Maruyama N. Yoshizawa Y. Yamada Y. Sato

X-ray diffraction (XRD) analysis is a fundamental method to evaluate the carbon stacking structure in coal and carbon materials. However, the vagueness of XRD pattern of coal, which has the low crystallinity, often makes it difficult to evaluate the stacking structure quantitatively. In a previous study [1,2], we reported the standard analysis of carbon stacking structure in coal by XRD techniq...

2009
Dodd Gray Adam McCaughan Bhaskar Mookerji

We analyze graphene and some of the carbon allotropes for which graphene sheets form the basis. The real-space and reciprocal crystalline structures are analyzed. Theoretical X-ray diffraction (XRD) patterns are obtained from this analysis and compared with experimental results. We show that staggered two-dimensional hexagonal lattices of graphite have XRD patterns that differ significantly fro...

2012
A. K. Sinha Archna Sagdeo Pooja Gupta Anuj Upadhyay Ashok Kumar M. N. Singh R. K. Gupta S. R. Kane A. Verma

Angle dispersive x-ray diffraction (ADXRD) is a basic non destructive tool for the determination of crystal structure. Energy tunability and high flux are added advantages in using synchrotron radiation (SR) source for ADXRD technique. We have installed an ADXRD beamline (BL-12) on Indus-2, the Indian synchrotron source. Indus-2 is a 2.5GeV, 300mA SR source. The beamline consists of a Si (311) ...

2009
Y L N Murthy I V Kasi Viswanath T. Kondala Rao Rajendra singh

Nano size nickel copper ferrite powders (NiCuFe2O4) have been prepared by a prepared by Co precipitation method. The resulting powders were characterized by X-ray diffraction (XRD), Scanning electron microscope (SEM).The result showed nanosize nickel copper ferrite(35.65nm). The powders showed extensive XRD line broadening and sizes of crystals observed from the XRD line broadening was35.65 nm,...

2017
Rohit Prasanna

X-ray diffraction is a commonly used experimental technique for identifying the structure of crystalline materials[3]. A crystalline material has its atoms arranged in periodic lattices with long-range symmetry. As a result, it scatters a beam of X-rays in well-defined patterns. Analysis of an X-ray diffraction pattern produced by a material yields extensive information about the structure of t...

2018
Mitsuo Shoji Hiroshi Isobe Ayako Tanaka Yoshimasa Fukushima Keisuke Kawakami Yasufumi Umena Nobuo Kamiya Takahito Nakajima Kizashi Yamaguchi

Tanaka et al. (J. Am. Chem. Soc., 2017, 139, 1718) recently reported the three-dimensional (3D) structure of the oxygen evolving complex (OEC) of photosystem II (PSII) by X-ray diffraction (XRD) using extremely low X-ray doses of 0.03 and 0.12 MGy. They observed two different 3D structures of the CaMn4O5 cluster with different hydrogen-bonding interactions in the S1 state of OEC keeping the sur...

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