Related Articles The Si3N4/TiN Interface: 4. Si3N4/TiN(001) Grown with a −250 V Substrate Bias and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy Surf. Sci. Spectra 19, 62 (2012) The Si3N4/TiN Interface: 1. TiN(001) Grown and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy Surf. Sci. Spectra 19, 33 (2012) The Si3N4/TiN Interface: 5. TiN/Si3N4 Grown...

Related Articles The Si3N4/TiN Interface: 4. Si3N4/TiN(001) Grown with a −250 V Substrate Bias and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy Surf. Sci. Spectra 19, 62 (2012) The Si3N4/TiN Interface: 1. TiN(001) Grown and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy Surf. Sci. Spectra 19, 33 (2012) The Si3N4/TiN Interface: 5. TiN/Si3N4 Grown...

Angle resolved x-ray photoelectron spectroscopic studies of a series of liquid mixtures of a perfluoropolyether ~Krytox 16350! and a polyphenylether ~Santovac-5! show that the former spreads on the latter and the film thickness could even be smaller than the photoelectron mean free path. The molecular ordering in krytox remain as that of the free liquid which is manifested in the enhancement of...

Via a real-time, cumulant based approach, the X-Ray Photoelectron Spectrum (XPS) for molecular C60 Buckminsterfullerene, Nickel, Iron, and Cobalt are computed. Good agreement with experiment is found in the case of C60. We also use this approach to compute quasi-particle peak shifts and weights. We find that in the case of the transition metals, the analytic calculation appears to be an overest...

High-resolution X-ray emission spectra (XES) are presented for minerals with a variety of structures. The participation of the Si 3p orbitals in bonding is influenced by the local structure around the silicon atom. In orthosilicates the distortion of the SiO44--tetrahedron influences both peak-width and the intensity of the high-energy shoulder of the Si-Kfl spectrum. In minerals containing Si-...

In the present study, silver nanoparticles (SNPs) were synthesized using broth of red algae Hypnea musciformis as reductant by a simple and eco-friendly route. The synthesized SNPs have been well characterized by using various analytical techniques, Zeta potential, Transmission Electron microscopic (TEM), X-ray diffraction (XRD), FTIR and further confirmed by X-ray photoelectron spectrum (XPS)....

The interplay between the angle-dependent X-ray reflectivity, X-ray absorption and the photoelectron attenuation length in the photoelectron emission process determines the optimal X-ray incidence angle that maximizes the photoelectron signal. Calculations in the wide VUV to the hard X-ray energy range show that the optimal angle becomes more grazing with increasing energy, from a few tens of d...

The soft-X ray range, between 1-10 nm wavelength, is highly interesting for X-ray microscopy. Taking advantage of it requires, however, to operate a high resolution instrument at a variable wavelength. We describe here an image converter X-ray microscope which is based on secondary pharoemission. This instrument is now developped at the Institut dlOptique (Orsay); it will be installed near ACO ...

a r t i c l e i n f o Keywords: Semiconductor–insulator interfaces Semiconductor–semiconductor thin film structures Silicon oxides Photoelectron emission Synchrotron radiation photoelectron spectroscopy Photoelectron emission microscopy (XPEEM) Fully energy-filtered X-ray photoelectron emission microscopy is used to analyze the spatial distribution of the silicon sub-oxide structure at the SiO ...